2014
DOI: 10.1016/j.orgel.2014.04.013
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Numerical analysis of capacitance compact models for organic thin-film transistors

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Cited by 11 publications
(10 citation statements)
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“…[213] Another vivid field is the conception of compact transistor models. [231][232][233] For transistors, all distinct device regions that can act as capacitances are of central importance. These capacitances inform to which extent and how fast charge carriers are rearranged in the transistors.…”
Section: Consideration Of Spatially Distinct Device Regionsmentioning
confidence: 99%
See 2 more Smart Citations
“…[213] Another vivid field is the conception of compact transistor models. [231][232][233] For transistors, all distinct device regions that can act as capacitances are of central importance. These capacitances inform to which extent and how fast charge carriers are rearranged in the transistors.…”
Section: Consideration Of Spatially Distinct Device Regionsmentioning
confidence: 99%
“…[231,233,235] For the latter reason, such models are conceived and bench-marked in a tight feedback loop with drift-diffusion-based simulations. [231,233] Typical applications comprise the determination of voltage-and frequency-dependent capacitances in transistors [231,233] and small circuits, [235] or time-dependence of charge accumulation. [231] While it appears to be straight-forward to inform the latter transistor models with more detailed drift-diffusion-based simulations, it is not established whether it is possible to rigorously extract a network of building blocks (seen above for OLEDs and transistors) from any drift-diffusion-based simulation.…”
Section: Consideration Of Spatially Distinct Device Regionsmentioning
confidence: 99%
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“…However in OTFTs, a frequency dependency of the capacitances is observed. In [13], it is reported that already in the kilohertz regime the frequency dependency start to play an important role.…”
Section: Differential Amplifiermentioning
confidence: 99%
“…where A is the area of a circular electrode with 1.1 mm of diameter, q is the elementary charge, ε 0 is the permittivity of vacuum, and ε r is the relative permittivity, here set to 3.0 [14]. Using Eq.…”
Section: Fabrication Of Mis Structure and C-v Measurementmentioning
confidence: 99%