2015
DOI: 10.1016/j.solener.2015.05.041
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Numerical analysis of degradation kinetics in CdTe thin films

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Cited by 10 publications
(7 citation statements)
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“…Under stress conditions, excess charge carriers, n , and p , generate, which cause the formation and increase of defects in the PSC [33] . Since the defect increment affects the behavior and performance of the device, the degradation rate of the device parameters can be modeled by monitoring the defect concentration [33] , [34] , [35] .…”
Section: Theorymentioning
confidence: 99%
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“…Under stress conditions, excess charge carriers, n , and p , generate, which cause the formation and increase of defects in the PSC [33] . Since the defect increment affects the behavior and performance of the device, the degradation rate of the device parameters can be modeled by monitoring the defect concentration [33] , [34] , [35] .…”
Section: Theorymentioning
confidence: 99%
“…Under stress conditions, excess charge carriers, n , and p , generate, which cause the formation and increase of defects in the PSC [33] . Since the defect increment affects the behavior and performance of the device, the degradation rate of the device parameters can be modeled by monitoring the defect concentration [33] , [34] , [35] . The kinetics of the excess carrier and excess defect creations are related as follows [36] , [37] , [38] : where α and β are the defect creation and annihilation rates related to the material parameters, and their values are assigned according to the defect type.…”
Section: Theorymentioning
confidence: 99%
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“…[ 16a ] Copyright 2015, Royal Society of Chemistry c) Trap density comparison of common commercial semiconductors and PVSK SCs. Reference: CIGS semiconductors: 1, [ 30 ] 2,3; [ 44 ] polycrystalline Si semiconductors: 1, [ 28b ] 2,3; [ 45 ] CdTe semiconductors: 1,2,3,4, [ 29 ] 5; [ 46 ] MAPbX 3 SCs: 1, [ 13b ] 2,3, [ 27b ] 4, [ 6c ] 5, [ 34a ] 6. [ 26b ]…”
Section: Introductionmentioning
confidence: 99%