2014
DOI: 10.1016/j.solener.2014.04.027
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Numerical simulation of bowing phenomenon in ultra-thin crystalline silicon solar cells

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Cited by 15 publications
(7 citation statements)
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“…The detailed process of the numerical simulation was described in our previous paper [13], and here we briefly summarize the overall procedure. As described in Fig.…”
Section: Brief Summary Of Developed Numerical Proceduresmentioning
confidence: 99%
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“…The detailed process of the numerical simulation was described in our previous paper [13], and here we briefly summarize the overall procedure. As described in Fig.…”
Section: Brief Summary Of Developed Numerical Proceduresmentioning
confidence: 99%
“…The silicon solar cell was initially heated up to the target temperature and then cooled down to room temperature by convection. A more detailed explanation on the recrystallized layer as well as a description of the simulation setup can be found elsewhere [13].…”
Section: Brief Summary Of Developed Numerical Proceduresmentioning
confidence: 99%
See 1 more Smart Citation
“…Typically, bowing and residual stress occurs during the fabrication of c-Si solar cells; back-surface field (BSF) formation. The degree of wafer bowing strongly depends on the thermal conditions during Al paste sintering [8]. This pehenomenon arises from mismatch of the thermal coefficient of expansion (TCE) between the silicon and the rear contact aluminum layers [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…The results revealed that the bowing degree increased with the decrease in the silicon layer thickness and increase in the aluminium layer thickness. 9 The longer life and greater reliability of satellites has put forward higher requirements for solar cells; both the property and the amount of adhesive are important factors affecting the performance of modern satellites. [10][11][12] In order to investigate the residual stress of the solar cell module after encapsulation, the distribution and evolution of the residual stress will be simulated during its encapsulation process with the finite element method, and the impacts of the encapsulation process parameters, such as the elastic modulus, the thickness of adhesive, and the curing temperature on the residual stress will be investigated.…”
Section: Introductionmentioning
confidence: 99%