2004
DOI: 10.1021/ac048732n
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Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy−SECM Probes Using the Boundary Element Method

Abstract: Integrated submicroelectrodes for combined AFM-SECM measurements are characterized with numerical simulations using the boundary element method. SECM approach curves and SECM images are calculated and analyzed for a model substrate containing pronounced topographical and electrochemical features. The theoretically calculated image has been compared to the experimental data and shows excellent quantitative agreement. Hence, the applicability of integrated AFM-SECM electrodes for combined electrochemical and top… Show more

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Cited by 56 publications
(68 citation statements)
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“…1,4,7 However, because of the inequality in eq 5, in the present system, the fulfillment of this fact implies that r hole /r tip is large enough compared to (Δi recycl ) lim = (π/4)r tip /l as follows from eq 2. However, since r hole /r tip is fixed by the system construction while (Δi recycl ) lim increases drastically when l f 0, the inequality in eq 5 dictates that, as soon as L < L min = (π/4)Â r tip /r hole , Δi recycl is necessarily limited by the performance of the remote disk rather than by the electrochemical properties of the probed one.…”
Section: ' Results and Discussionmentioning
confidence: 75%
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“…1,4,7 However, because of the inequality in eq 5, in the present system, the fulfillment of this fact implies that r hole /r tip is large enough compared to (Δi recycl ) lim = (π/4)r tip /l as follows from eq 2. However, since r hole /r tip is fixed by the system construction while (Δi recycl ) lim increases drastically when l f 0, the inequality in eq 5 dictates that, as soon as L < L min = (π/4)Â r tip /r hole , Δi recycl is necessarily limited by the performance of the remote disk rather than by the electrochemical properties of the probed one.…”
Section: ' Results and Discussionmentioning
confidence: 75%
“…Whenever the substrate may perform as a perfect collector, 6 at tipÀsubstrate distances, l, small enough for I nf to be negligible, 1,4,7 I tip is expected to tend toward the current value observed in the thin-layer cell composed by the two facing electrodes. If the substrate is much wider than the tip, this limiting value should be controlled only by the tip surface area and the tipÀsubstrate distance.…”
Section: ' Results and Discussionmentioning
confidence: 99%
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“…20,21 For a rather long time, instrumental developments have aimed at increasing the lateral resolution and providing complementary information such as topography and local reactivity from complex samples. For instance, combination of the SECM principle with atomic force microscopy (AFM) [22][23][24][25][26][27][28][29][30][31][32] …”
mentioning
confidence: 99%