2016
DOI: 10.1016/j.microrel.2016.03.034
|View full text |Cite
|
Sign up to set email alerts
|

Numerical simulation of the electrical performance of printed circuit boards under cyclic thermal loads

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
3
3

Relationship

0
6

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 23 publications
0
3
0
Order By: Relevance
“…Void damage was triggered within copper path during plastic cycling. This damage mechanism was also adopted in Fellner et al [4] who made a correlation between the evolution of the electrical resistance and the void volume fraction.…”
Section: Introductionmentioning
confidence: 99%
“…Void damage was triggered within copper path during plastic cycling. This damage mechanism was also adopted in Fellner et al [4] who made a correlation between the evolution of the electrical resistance and the void volume fraction.…”
Section: Introductionmentioning
confidence: 99%
“…Some authors [2], [3], [4], [5], [6], [7] address this subject to evaluate the reliability of PTHs by the mean of finite element simulations. In [3], [4], [5], [6], the fatigue behavior of electrodeposited copper was studied by submitting PTHs to thermal loadings. But this method does not permit direct strain measurements and the link between strain and failure has to be carried out through the numerical simulation of a PCB.…”
Section: Introductionmentioning
confidence: 99%
“…However, copper exhibits kinematic hardening. Therefore, this behavior has been taken into account by Fellner et al [6] or Fu et al [12] for PTH studies. Fu et al [12] used a model identified on wrought copper, whereas Fellner et al [6] worked on a copper grade used in PCBs.…”
Section: Introductionmentioning
confidence: 99%