OBIST methodology incorporating modified sensitivity of pulses for active analogue filter components

Khade, R. H.; Chaudhari, Devendra S.

doi:10.1080/00207217.2017.1376712

Cited by 4 publications

(4 citation statements)

References 17 publications

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“…Some works present OBIST systems implemented using discrete components and the impact of switches in the feedback circuit has been investigated [5,6]. Another approach of the OBIST system is to compare a fault-free circuit to a faulty circuit, and the difference of the counted pulses can be estimated, highlighting the level of parametric faults in the CUT [9]. Similarly to the OBIST system presented in Reference [9], a phase shift between fault-free and faulty circuits could be estimated [35].…”

Section: Discussionmentioning

confidence: 99%

“…Another approach of the OBIST system is to compare a fault-free circuit to a faulty circuit, and the difference of the counted pulses can be estimated, highlighting the level of parametric faults in the CUT [9]. Similarly to the OBIST system presented in Reference [9], a phase shift between fault-free and faulty circuits could be estimated [35]. In the case of catastrophic fault detection, an on-chip Schmitt oscillator could be used as a reference signal for counting CUT pulses, but such approach cannot be used for the detection of parametric faults [28].…”

Section: Discussionmentioning

confidence: 99%

“…Variation of oscillation frequency is not directly related to a change of parameters of a circuit which is used as a CUT [8], but it shows adequate indication of any variations, based on which test results are selected. In other works, the oscillation based built-in self-test (OBIST) method has been implemented in low operating frequency filters [9], tested on discrete boards [5,6], thus implementation in CMOS technology has not been analyzed. In other studies, the proposed test method has been implemented in CMOS technology [10][11][12] and investigated on feedback circuit impedance matching [13], but investigation on different structures of filters and natural, non-pre-tuned fault estimation systems, is limited.…”

Section: Introductionmentioning

confidence: 99%

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Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

2019

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In this paper, an oscillation-based built-in self-test system for active an analog integrated circuit is presented. This built-in self-test system was used to detect catastrophic and parametric faults, introduced during chip manufacturing. As circuits under test (CUT), second-order Sallen-Key, Akerberg-Mossberg and Tow-Thomas biquad filters were designed. The proposed test hardware detects parametric and catastrophic faults on changeable limits. The influence of both oscillation and test hardware on fault detection limits were investigated and analyzed. The proposed oscillation based self-test system was designed and simulated in 0.18 µm complementary metal-oxide semiconductor (CMOS) technology. Due to the easiness of implementation and configuration for testing of different active analog filters, such self-test systems can be effectively used in modern integrated circuits, made of a large number of devices and circuits, such as the multi-standard transceivers used in the core hardware of software-defined radios. Using the proposed test strategy, the fault tolerance limits for catastrophic faults varied from 96% to 100% for all injected faults in different structures of low pass filters (LPF). The detection range of parametric faults of passive components’ nominal value, depending on the used structure of the filter, did not exceed –0.74% – 0.72% in case of Sallen-Key, –3.31% – 1.00% in case of Akerberg-Mossberg and –2.39% – 1.44% in case of Tow-Thomas LPF.

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Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

2019

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“…Kač and Novak [9] offered the approach to transformation of switched-capacitor filter stages for oscillation-based testing. The pulses of oscillating output signals are used in [10] for generating the signature, harnessed for the fault detection. Oscillation-based test is applied in [16] to the second-generation Current Conveyor (CCII) based filters as a case study.…”

Section: Introductionmentioning

confidence: 99%

Analogue Integrated Circuits Design-for-Testability Flow Oriented onto OBIST Strategy

Mosin

2018

ITC

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Belaidžio ryšio siųstuvų-imtuvų filtrų savitestavimo ir autokalibravimo metodų sukūrimas ir tyrimas

Kladovščikov¹

2020

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OBIST methodology incorporating modified sensitivity of pulses for active analogue filter components

Cited by 4 publications

References 17 publications

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Analogue Integrated Circuits Design-for-Testability Flow Oriented onto OBIST Strategy

Belaidžio ryšio siųstuvų-imtuvų filtrų savitestavimo ir autokalibravimo metodų sukūrimas ir tyrimas

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