1978
DOI: 10.1109/tmag.1978.1059910
|View full text |Cite
|
Sign up to set email alerts
|

Observation of a domain drag effect in amorphous GdCoMo films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

1979
1979
2006
2006

Publication Types

Select...
5
3

Relationship

0
8

Authors

Journals

citations
Cited by 19 publications
(3 citation statements)
references
References 8 publications
0
3
0
Order By: Relevance
“…This force is due to the magnetic field generated by the zig-zagging current acting back on the domain structure. This effect has been observed in magneto-optic studies of perpendicularly magnetized current carrying wires [22].…”
Section: Hall Effectmentioning
confidence: 53%
“…This force is due to the magnetic field generated by the zig-zagging current acting back on the domain structure. This effect has been observed in magneto-optic studies of perpendicularly magnetized current carrying wires [22].…”
Section: Hall Effectmentioning
confidence: 53%
“…The recently proposed VCR-voltage controlled rotation [2] is very appealing, but the fabrication requirements appear to be quite stringent. In this paper, we are interested in exploiting the well-known phenomena of domain drag induced by current pulses and applying the technique to small patterned structures similar to studies of patterned GdCoMo films [3]. The devices that could potentially benefit from these investigations are magnetic tunnel junctions [4], as well as MRAM's and spin transistors that utilize Permalloy as a spin sensing electrode.…”
Section: Introductionmentioning
confidence: 99%
“…domain drag effect. 16 Such current-induced domain wall motion has been clearly visualized by magnetic force microscopy in metallic systems 17 and by magneto-optic imaging in ferromagnetic semiconductors. 7 It is worth noting that for the semiconductor case the domain wall motion can be driven by a current density of 10 5 A/cm 2 , 6 which is two to three orders of magnitude smaller than that required in metals.…”
mentioning
confidence: 99%