1995
DOI: 10.1063/1.114376
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Observation of a nanocrystalline-to-amorphous phase transition in luminescent porous silicon

Abstract: Nanocrystalline silicon aggregates imbedded in a predominantly amorphous silicon layer have been observed in anodically etched p-Si(100) by using valence band x-ray photoelectron spectroscopy and lattice imaged high-resolution transmission electron microscopy (XTEM). XTEM has identified the as-prepared porous silicon to be a mixed phase of amorphous and nanocrystalline silicon, with the nanocrystalline aggregates being randomly dispersed throughout the full thickness of a 1 μm thick amorphous layer and exhibit… Show more

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Cited by 20 publications
(3 citation statements)
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“…To this purpose, we acquired the VB spectra for all samples, which are shown in figure 7a. The VB spectrum for the SiNP sample is in a good agreement with those reported for porous Si [28]. The VB maximum (VBM) was estimated using standard method as described elsewhere [22,29].…”
Section: Valence Band Analysissupporting
confidence: 72%
“…To this purpose, we acquired the VB spectra for all samples, which are shown in figure 7a. The VB spectrum for the SiNP sample is in a good agreement with those reported for porous Si [28]. The VB maximum (VBM) was estimated using standard method as described elsewhere [22,29].…”
Section: Valence Band Analysissupporting
confidence: 72%
“…In the case of irradiation of Si-nc or porous Si with electrons, X-ray, gammy-ray and He + , similar quenching has been observed [28][29][30][31]. Quenching of the PL is related to the decrease in the number of nanocrystals, fast neutron collisions with nanocrystals induce the nanocrystals amorphous, which is proved by LRS analysis.…”
Section: Discussionmentioning
confidence: 62%
“…29 Figure 2d confirms that the anodized layer is an assembly of Si nanocrystal spheres and an amorphous phase. 30,31 Compared with a 633 nm laser, 23 the inhibition effect of the 830 nm laser on the anodization is weaker due to the lower absorption in silicon. However, the PL peak locations were the same (635 nm) even though the wavelength of the incident laser was different.…”
Section: ++mentioning
confidence: 99%