“…7. Deep-level transient spectroscopy spectrum of a QW ͑Ge concentration xϭ0.5 and QW thickness d QW ϭ3 nm͒ measured for a mesa Schottky diode ͑diameter 0.5 mm, hϭ130 nm, Dϭ240 nm͒ at the reverse bias U R *ϭ2.5 V and the pulse frequency f ϭ2500 s Ϫ1 ͑corresponding to emission rate window e 0 ϭ5580 s Ϫ1 ͒ for different pulse biases U 1 : ͑a͒ 0 V, ͑b͒ 1 V, ͑c͒ 1.5 V, and ͑d͒ 2.0 V. The pulse duration was t p ϭ5 s. 5 and QW thickness d QW ϭ2 nm͒ measured for a planar Schottky diode ͑diameter 0.5 mm, cap layer thickness Dϭ210 nm͒ at the reverse bias U R *ϭ0.6 V, the pulse bias U 1 ϭϪ0.2 V, and the pulse frequency f ϭ100 s Ϫ1 ͑corresponding to emission rate window e 0 ϭ220 s Ϫ1 ͒ for different pulse duration t p : ͑a͒ 0.1 s, ͑b͒ 0.5 s, ͑c͒ 4 s, ͑d͒ 40 s, and ͑e͒ 400 s.…”