Observation of heavy ion induced transients in linear circuits

Ecoffet, R.; Duzellier, S.; Tastet, P.; Aicardi, Corinne; Labrunee, M.

doi:10.1109/redw.1994.633038

Cited by 68 publications

(15 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Since that time many part types have been characterized for SETs in a variety of circuit configurations and with a wide range of bias conditions [2,3]. Bipolar linear circuit SETs have been shown to be responsible for system upsets [3] and, hence, have become an issue for space system hardness assurance.…”

Section: Introductionmentioning

confidence: 99%

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

Pease¹,

Sternberg

Boulghassoul

et al. 2002

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

Abstract--Generally good agreement was obtained between the single-event output voltage transient waveforms obtained by exposing individual circuit elements of a bipolar comparator and operational amplifier to an ion microbeam, a pulsed laser beam, and circuit simulations using SPICE. The agreement was achieved by adjusting the amounts of charge deposited by the laser or injected in the SPICE simulations. The implications for radiation hardness assurance are discussed.

show abstract

Section: Introductionmentioning

confidence: 99%

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

Pease¹,

Sternberg

Boulghassoul

et al. 2002

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

show abstract

“…Satellite system designers and parts engineers, however, are not always aware of single event transient issues. Over the past few years, several publications have noted the effects of SETs in linear devices [3][4][5], combinational logic [6][7][8], and optical subsystems [9][10][11][12][13][14][15][16][17][18][19][20]. The optocoupler, being a combination of an optical system and a linear device, has not previously been investigated in this regard.…”

Section: Introductionmentioning

confidence: 99%

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

LaBel

Marshall

et al. 1997

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

We present data on recent optocoupler in-flight anomalies and the subsequent ground test irradiation performed. Discussions of the single event mechanisms involved, transient filtering analysis, and design implications are included. Proton-induced transients were observed on higher speed optocouplers with a unique dependence on the incidence particle angle. The results indicate that both direct ionization and nuclear reaction-related mechanisms are responsible for the single events observed.

show abstract

“…Also high SET sensitivities were recorded when testing the RH1078 in a close loop amplifier configuration and the PMnM139 as a comparator.Presented results, primarily obtained on XMM flight Iot devices, were taken using test set-ups and test conditions coming close to conditions used in the satellite. As previously reported in [ 1][2][3][4][5] and verified here, test set-ups, test…”

supporting

confidence: 88%

Single event transient characterisation of analog IC's for ESA's satellites

Harboe-Sørensen

Guerre²,

Constans³

et al.

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

View full text Add to dashboard Cite

AbstrectThe analysis of four self switch-off events in power supply on-board ESA's SOHO satellite point strongly in the direction of being cosmic ray or proton induced. Detailed analysis of the relevant power supply schematics identified a number of analog IC's capable of causing or contributing to such This paper details the effort taken in order to characterise the upset sensitivity of the various analog IC's flown. Testing aspects and Single Event Transient (SET) results will be presented. Ground testing, simulating the flight conditions, were carried out at both heavy ion and proton accelerators. events P I PIt31[41 PI.

show abstract

Observation of heavy ion induced transients in linear circuits

Cited by 68 publications

References 2 publications

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

Single event transient characterisation of analog IC's for ESA's satellites

Contact Info

Product

Resources

About