2013
DOI: 10.1002/pip.2393
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Observed degradation in photovoltaic plants affected by hot‐spots

Abstract: A number of findings have shown that the test procedures currently available to determine the reliability and durability of photovoltaic (PV) modules are insufficient to detect certain problems. To improve these procedures, ongoing research into the actual performance of the modules in the field is required. However, scientific literature contains but few references to field studies of defective modules. This article studies two different localized heating phenomena affecting the PV modules of two large-scale … Show more

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Cited by 43 publications
(24 citation statements)
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“…1 shows two infrared (IR) images of hot-spots. The anomalies that cause hot-spots can be external to the PV module: shading (Alonso- García et al, 2003;Herrmann et al, 1997;Molenbroek et al, 1991) or dust (Lorenzo et al, 2014); or internal: micro-cracks (Brun and Melkote, 2009;Buerhop et al, 2012;García et al, 2013;Grunow et al, 2005;Paggi and Sapora, 2013;, defective soldering (Buerhop et al, 2012;Chaturvedi et al, 2013;Gabor et al, 2006;García et al, 2013;Muñoz et al, 2008), potential induced degradation (Berghold et al, 2013;Hacke et al, 2010), material imperfections (Vasko et al, 2014). In general, a hot-spot entails a decrease of the operational efficiency of the PV module.…”
Section: Introductionmentioning
confidence: 96%
See 1 more Smart Citation
“…1 shows two infrared (IR) images of hot-spots. The anomalies that cause hot-spots can be external to the PV module: shading (Alonso- García et al, 2003;Herrmann et al, 1997;Molenbroek et al, 1991) or dust (Lorenzo et al, 2014); or internal: micro-cracks (Brun and Melkote, 2009;Buerhop et al, 2012;García et al, 2013;Grunow et al, 2005;Paggi and Sapora, 2013;, defective soldering (Buerhop et al, 2012;Chaturvedi et al, 2013;Gabor et al, 2006;García et al, 2013;Muñoz et al, 2008), potential induced degradation (Berghold et al, 2013;Hacke et al, 2010), material imperfections (Vasko et al, 2014). In general, a hot-spot entails a decrease of the operational efficiency of the PV module.…”
Section: Introductionmentioning
confidence: 96%
“…In general, a hot-spot entails a decrease of the operational efficiency of the PV module. Moreover, when a hot-spot persists over time, it entails a risk for the PV module's lifetime (Buerhop et al, 2012;García et al, 2013;Muñ oz et al, 2011;Osterwald and McMahon, 2009;Radziemska, 2003;Simon and Meyer, 2010;Soló rzano and Egido, 2014).…”
Section: Introductionmentioning
confidence: 99%
“…The use of bypass diodes across PV strings is standard practice that is required in crystalline silicon PV panels [19]. Their purpose is to prevent hot spot damage that can occur in series-connected PV cells [20][21][22].…”
Section: Introductionmentioning
confidence: 99%
“…The IES-UPM played the role of independent experts at different stages of the projects: defining the initial production expectation, measuring PV modules and preparing some of them to act as reference modules in the field (to measure the operating conditions), and accomplishing the in-field measurements during the commissioning of the plant. Taking advantage of the previous IES-UPM knowledge and of this in-field work accomplished in the Spanish PV plants, numerous studies were published, facing the improvement of measurement procedures, the detection of early degradation phenomena and the development of proper indexes and methods to evaluate the initial state of health of PV installations (García, 2014) (Martínez-Moreno, 2012) (Martínez-Moreno, 2010).…”
Section: State Of the Art And Objectivesmentioning
confidence: 99%