2015
DOI: 10.1016/j.micron.2014.07.009
|View full text |Cite
|
Sign up to set email alerts
|

Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity

Abstract: Transmission electron microscopy (TEM) has become an indispensable technique for studying heterogeneous catalysts. In particular, advancements of aberration-corrected electron optics and data acquisition schemes have made TEM capable of delivering images of catalysts with sub-Ångström resolution and single-atom sensitivity. Parallel developments of differentially pumped electron microscopes and of gas cells enable in situ observations of catalysts during the exposure to reactive gas environments at pressures o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
74
0

Year Published

2015
2015
2021
2021

Publication Types

Select...
4
3

Relationship

1
6

Authors

Journals

citations
Cited by 58 publications
(74 citation statements)
references
References 62 publications
0
74
0
Order By: Relevance
“…0.1 % for a temperature increase from 40 to 400 °C (calculated using a linear expansion coefficient of 2.5 • 10 −6 K −1 [37]) and can therefore be neglected. Sample drift is expected to increase slightly with temperature for the MEMS device and would, if anything, worsen the apparent resolution [38]. In contrast to the thermal expansion and drift, the measured electrical resistivity of the semiconducting SiC film decreased markedly from 12 to 7 kΩ upon heating up from 40 to 400 °C.…”
Section: Resultsmentioning
confidence: 99%
“…0.1 % for a temperature increase from 40 to 400 °C (calculated using a linear expansion coefficient of 2.5 • 10 −6 K −1 [37]) and can therefore be neglected. Sample drift is expected to increase slightly with temperature for the MEMS device and would, if anything, worsen the apparent resolution [38]. In contrast to the thermal expansion and drift, the measured electrical resistivity of the semiconducting SiC film decreased markedly from 12 to 7 kΩ upon heating up from 40 to 400 °C.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, low-dose-rate in-line holography is exceptionally benefi cial to environmental electron microscopy. [ 16 ] Certainly, its capabilities are needed to better understand artifi cial photosynthetic systems, as described in in ref. [ 17 ] This contribution describes underlying principles in detail and points toward fi rst applications.…”
Section: Low-dose-rate Electron Microscopymentioning
confidence: 99%
“…In reactive environments, the oxide surface can undergo substantial reconstruction and exchange oxygen atoms with the gas phase, and the changes in structural coordination and oxidation state of the metal ions can markedly influence the catalytic properties. These redox processes are, however, scarcely understood, reflecting a lack of atomically resolved observations of oxide surfaces under meaningful reaction conditions.With recent advances, transmission electron microscopy has become capable of delivering atomically resolved images of catalyst in situ during exposure to reactive gas environments and elevated temperatures [1][2][3]. Observations of catalyst surfaces are, however, prone to alterations caused by the electron beam due to their reduced atomic coordination.…”
mentioning
confidence: 99%
“…With recent advances, transmission electron microscopy has become capable of delivering atomically resolved images of catalyst in situ during exposure to reactive gas environments and elevated temperatures [1][2][3]. Observations of catalyst surfaces are, however, prone to alterations caused by the electron beam due to their reduced atomic coordination.…”
mentioning
confidence: 99%
See 1 more Smart Citation