Off-axis reflection zone plate for quantitative soft x-ray source characterization

Wilhein, Thomas; Hambach, D.; Niemann, B.; Berglund, Magnus; Rymell, L.; Hertz, Hans M.

doi:10.1063/1.119497

Cited by 49 publications

(34 citation statements)

References 7 publications

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“…As shown in Fig. 2, not the full elliptical lens structure is illuminated but only an off-axis section marked by deep blue color [31,32]. This off-axis section can be used as an ideal monochromator.…”

Section: Generation Of Xuv Lightmentioning

confidence: 99%

Monochromatization of femtosecond XUV light pulses with the use of reflection zone plates

Metje¹,

Borgwardt²,

Moguilevski³

et al. 2014

Opt. Express

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Abstract:We report on a newly built laser-based tabletop setup which enables generation of femtosecond light pulses in the XUV range employing the process of high-order harmonic generation (HHG) in a gas medium. The spatial, spectral, and temporal characteristics of the XUV beam are presented. Monochromatization of XUV light with minimum temporal pulse distortion is the central issue of this work. Off-center reflection zone plates are shown to be superior to gratings when selection of a desired harmonic is carried out with the use of a single optical element. A cross correlation technique was applied to characterize the performance of the zone plates in the time domain. By using laser pulses of 25 fs length to pump the HHG process, a pulse duration of 45 fs for monochromatized harmonics was achieved in the present setup. R. Leone, "Ultrafast time-resolved soft X-Ray photoelectron spectroscopy of dissociating Br 2 ," Phys. Rev. Lett. 87, 193002 (2001 265-267 (1986

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Section: Generation Of Xuv Lightmentioning

confidence: 99%

Monochromatization of femtosecond XUV light pulses with the use of reflection zone plates

Metje¹,

Borgwardt²,

Moguilevski³

et al. 2014

Opt. Express

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“…Light elements, however, are the building blocks of all compounds relevant in biology and life research. Additionally, the detection efficiency of soft X-ray spectrometers is also low due to grazing incidence gratings and long distances between source and optical element, which lead to a very small solid angle [13][14][15]. This results in a need for brilliant light sources.…”

Section: Introductionmentioning

confidence: 99%

“…This results in a need for brilliant light sources. Soft X-ray spectrometers based on gratings in Rowland circle design or varied line spacing gratings are well-established instrumentation around the world [11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26][27]. Depending on the experimental requirements, some reach theoretically high resolution up to E/ΔE = 10 5 .…”

Section: Introductionmentioning

confidence: 99%

Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements

Yin¹,

Rehanek²,

Löchel³

et al. 2017

Opt. Express

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Abstract:We present a newly designed compact and flexible soft X-ray spectrometer for resonant inelastic X-ray scattering (RIXS) studies within an energy range from 380 eV to 410 eV, which would include the K alpha emission lines of vital elements like nitrogen. We utilized an off-axis reflection zone plate (RZP) as the wavelength selective element with a maximum line density of 10000 l/mm. A higher energy resolution over a broader range of ± 15 eV around the designed energy was achieved by displacing the RZP. Additionally, for the first time, an actual optical side effect, the so-called comatic aberration was exploited to increase the energy resolution. First results show a resolving power in the order of 1300 for photon energy of 395 eV, which is comparable to a commercial varied line spacing grating (VLS). Assoufid, and A. Erko, "Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism," Opt. Lett. 41(1), 29-32 (2016). 30. R. Mitzner,

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“…On one hand, the reflection geometry is an obvious solution to break the general resolution limit of transmission optics due to volume diffraction effects [14], in the extreme UV and soft x-ray regimes [8][9][10]15] as well as for hard x rays [16][17][18][19]. On the other hand, to prevent radiation damage, a reflection optical element can be simply and effectively cooled.…”

mentioning

confidence: 99%

“…Their boundaries can be calculated by setting the optical retardation to nλ AE λ 4 . The optical element described so far is essentially a reflection zone plate [8][9][10]. It becomes a reflection photon sieve by centering appropriately shaped nanomirrors, e.g., cylinders, on the dark areas such that the number of nanomirrors decreases smoothly from the center to the boundary of the illuminated area (see Fig.…”

mentioning

confidence: 99%

Focusing light with a reflection photon sieve

et al. 2011

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An advanced type of diffractive optical element is presented that combines the concept of the photon sieve with an offaxis, off-normal incidence reflection geometry. Compared to transmission optical elements, the signal-to-background ratio is significantly increased by separating the first from other diffraction orders without drastically reducing the size of the smallest diffractive element. The reflection photon sieve produces sharp foci at maximum contrast and offers the advantages of effective heat dissipation and a large working space above the focal plane. Experimental results for a device working at a photon energy of 100 eV are presented and compared to theory. © 2011 Optical Society of America OCIS codes: 230.1950, 340.7480. The parallel progress in nanofabrication and in the generation of highly brilliant synchrotron radiation has significantly advanced many spectroscopy, scattering, and imaging techniques by pushing them to nanometer-scale spatial resolution over a large part of the electromagnetic spectrum [1,2]. In the extreme UV to soft x-ray regimes, where strong absorption rules out the use of refractive lenses [3], transmission Fresnel zone plates [3-6] currently provide the best spatial resolution. Yet these diffractive optical elements commonly suffer from high background signals due to overlapping diffraction orders, strong secondary intensity maxima resulting from finite size effects, and limited working space between apertures and samples. Here we introduce a novel type of diffraction optics-a reflection photon sieve-that overcomes these limitations by using properly placed nanomirrors or nanoabsorbers [7] to obtain nanometer-scale foci of electromagnetic radiation in an off-axis, off-normal incidence reflection geometry. In addition to excellent focusing properties and good sample access, the design of the device allows for effective heat dissipation. The diffractive imaging of a pointlike source by a reflection photon sieve is schematically illustrated in Fig. 1. When monochromatic light illuminates the optical element under an angle of incidence α, the wave is both directly reflected (zero-order diffraction) and focused into different spots under different diffraction angles β (firstand higher-order diffraction). The curved dark areas on the device indicate the wave paths that contribute constructively to the focal spots. In the actual device these areas would be highly reflective, while the surrounding area would be made of a highly absorbing material. In coordinates of r and s, the condition for constructive interference is given bywhere p and q are the object and image distance, m is the diffraction order, and nλ the optical retardation between different diffraction areas (λ, wavelength; n, integer). Their boundaries can be calculated by setting the optical retardation to nλ AE λ 4 . The optical element described so far is essentially a reflection zone plate [8][9][10]. It becomes a reflection photon sieve by centering appropriately shaped nanomirrors, e.g., cylinders, on the dark...

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Off-axis reflection zone plate for quantitative soft x-ray source characterization

Abstract: Design and application of a zone plate monochromator for laboratory soft x-ray sources Rev. Sci. Instrum. 72, 53 (2001); A slit grating spectrograph for quantitative soft x-ray spectroscopy Rev.

Cited by 49 publications

References 7 publications

Monochromatization of femtosecond XUV light pulses with the use of reflection zone plates

Monochromatization of femtosecond XUV light pulses with the use of reflection zone plates

Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements

Focusing light with a reflection photon sieve

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