1991
DOI: 10.1002/jcc.540120216
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On a proposed radiation‐induced polaronic hole in silicon dioxide

Abstract: Ab-initio self-consistent-field molecular-orbital (SCF MO) Hartree-Fock (HF) calculations using the STO-3G, 6-31G, and 6-31G' basis sets, were performed to model quasi-tetrahedral silicon species in silicon dioxide.Mostly nine-atom clusters, [Si(OH),]9t, with charge number qt = 0 or + 1, were studied. The positions of the Si and 0 atoms were varied to achieve minimum total energies, while the protons were held fixed in the 0-(neighboring)Si direction to simulate the rigid crystal surroundings. The aquartz-type… Show more

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Cited by 13 publications
(2 citation statements)
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“…The cluster dangling bonds have been saturated by H atoms, a commonly used technique to ''embed'' clusters of semiconducting or insulating materials. [21][22][23][24][25][26][27][28][29][30][31] The positions of the cluster atoms were initially fixed to those of ␣-quartz derived from x-ray diffraction data at 94 K. 32 The embedding H atoms were fixed at a distance of 0.96 Å from the respective O atoms along the O-Si directions of ␣-quartz. The position of all the Si and O atoms of the cluster has been fully optimized.…”
Section: A Cluster Models and Wave Functionsmentioning
confidence: 99%
“…The cluster dangling bonds have been saturated by H atoms, a commonly used technique to ''embed'' clusters of semiconducting or insulating materials. [21][22][23][24][25][26][27][28][29][30][31] The positions of the cluster atoms were initially fixed to those of ␣-quartz derived from x-ray diffraction data at 94 K. 32 The embedding H atoms were fixed at a distance of 0.96 Å from the respective O atoms along the O-Si directions of ␣-quartz. The position of all the Si and O atoms of the cluster has been fully optimized.…”
Section: A Cluster Models and Wave Functionsmentioning
confidence: 99%
“…This shortcoming could be overcome by means of quantum chemical methods. In recent years, these methods, making no a priori assumptions about the electronic density distribution in the pcrfcct solid or in the vicinity of the defect under study (and often not even about the ionic relaxation in the surrounding lattice), have been used many times for the investigation of spectroscopic properties of point defects in wide-gap insulating solids [24][25][26][27][28][29][30][31][32][33][34][35] and have demonstrated their high reliability.…”
mentioning
confidence: 99%