2015
DOI: 10.1109/jssc.2014.2378280
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On-Chip Measurement of Clock and Data Jitter With Sub-Picosecond Accuracy for 10 Gb/s Multilane CDRs

Abstract: On-chip jitter measurement can be used to optimize the performance of wireline transceivers. In this work, the jitter of random data is measured on-chip by correlating the phase detector outputs from two adjacent CDR lanes. This allows the jitter's autocorrelation function to be estimated, from which the jitter's RMS value and power spectral density are extracted without using any external reference clock. The RMS value of random jitter ranging from 0.85 ps to 1.89 ps, and sinusoidal jitter from 0.89 ps to 5.1… Show more

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Cited by 16 publications
(4 citation statements)
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“…The degree of the eye margin degradation depends on the nature of the transmit jitter, the CDR gain, CDR bandwidth and its own jitter [27]. As such wireline transceiver designers have focused on characterizing and suppressing jitter for signal integrity purposes [28], [29]. In this work, it is ensured that these signal integrity considerations for high fidelity communications are maintained by message source driven equalization, and a parallel operation at the receiver extracts the transceiver jitter to be used for message source authentication.…”
Section: Jitter In Wireline Linksmentioning
confidence: 99%
“…The degree of the eye margin degradation depends on the nature of the transmit jitter, the CDR gain, CDR bandwidth and its own jitter [27]. As such wireline transceiver designers have focused on characterizing and suppressing jitter for signal integrity purposes [28], [29]. In this work, it is ensured that these signal integrity considerations for high fidelity communications are maintained by message source driven equalization, and a parallel operation at the receiver extracts the transceiver jitter to be used for message source authentication.…”
Section: Jitter In Wireline Linksmentioning
confidence: 99%
“…In Fig. 5 to extract K E F F the following set of expressions from [9], [10] and [11] has been used in conjunction with the nonlinear simulation results:…”
Section: Dpc Modellingmentioning
confidence: 99%
“…A control register is used to program the different operation modes which include the calibration of the NT delay, the calibration of the delay lines, the selection of the measurement bin, and the operations of shifting data in and out for instrument programming and readout. This is facilitated by a standard 2.5 GHz 0.4 ps (1) 3.2 10 -3 130 nm [8] 0.82 GHz 0.031 ps 0.49 10 -3 65 nm [14] 5 GHz ≤1 ps 0.32 65 nm [5] 6 GHz 0.31 ps 15 10 -3 65 nm…”
Section: Time Difference Amplifiermentioning
confidence: 99%