2013
DOI: 10.1016/j.ssi.2013.03.024
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On conditions leading to crossing of I–V curve in metal1|mixed-ionic–electronic-conductor|metal2 devices

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Cited by 15 publications
(27 citation statements)
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“…An asymmetric I-V curve of the 12AZO device may have occurred because of the modification of the Schottky barrier height at each interface as a result of the differences in the work function between the top and bottom electrodes [38]. A series of I-V sweep tests were conducted to determine whether the work function of electrodes was responsible for the asymmetric behavior and also the existence of the Schottky barrier at the bottom electrode.…”
Section: Resultsmentioning
confidence: 99%
“…An asymmetric I-V curve of the 12AZO device may have occurred because of the modification of the Schottky barrier height at each interface as a result of the differences in the work function between the top and bottom electrodes [38]. A series of I-V sweep tests were conducted to determine whether the work function of electrodes was responsible for the asymmetric behavior and also the existence of the Schottky barrier at the bottom electrode.…”
Section: Resultsmentioning
confidence: 99%
“…In the following, we provide a short review of the dynamic I – V analysis method and the assumptions made in its application. In general, the I–V relations (where the applied voltage, for instance, is a periodic triangular waveform) of a thin mixed ionic–electronic conductor placed between two ion blocking and electronically conducting electrodes are nonlinear if an applied voltage has a sufficiently high amplitude and low frequency . In that case, the I–V curve has a characteristic hysteretic shape, exhibiting a peak current followed by a region with a dynamic negative differential resistance (e.g., see Figure b).…”
Section: Methods and Theorymentioning
confidence: 99%
“…For an MIEC with a prevailing electronic conductivity, a typical situation for a reduced oxide at low temperatures, the local depletion in oxygen vacancies leads to an increase in total resistance. This phenomenon was previously modeled in detail by solving the electrically coupled ion and electron transport equations . It was further demonstrated that the characteristic physical time constant of the MIEC, the oxygen vacancy drift time through the MIEC length, can be determined from the time at which the peak current is reached, t peak (time‐to‐peak parameter), for a given voltage sweep rate, a SR , of a periodic triangular waveform .…”
Section: Methods and Theorymentioning
confidence: 99%
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