Proceedings of the 35th International Conference on Computer-Aided Design 2016
DOI: 10.1145/2966986.2967061
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On detecting delay anomalies introduced by hardware trojans

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Cited by 23 publications
(6 citation statements)
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“…Ismari et al [40] Delay based SCA Simulation On-chip embedded test structure to reduce effects of intra-die PV Esirci et al [27] Delay based SCA Simulation Statistical analysis of delays in correlated paths 2017 He et al [35] EM based SCA Simulation Simulation data from RTL design is used to generate the EM fingerprint 2017 Sree et al [65,67] ATPG with SCA Self-Referencing…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Ismari et al [40] Delay based SCA Simulation On-chip embedded test structure to reduce effects of intra-die PV Esirci et al [27] Delay based SCA Simulation Statistical analysis of delays in correlated paths 2017 He et al [35] EM based SCA Simulation Simulation data from RTL design is used to generate the EM fingerprint 2017 Sree et al [65,67] ATPG with SCA Self-Referencing…”
Section: Discussionmentioning
confidence: 99%
“…The resultant path delay ratio(ratio of suspected path to correlated path) values of the HT infected IC must be a significantly larger from the ratio values of the HT-free IC. A delay-based detection method has been proposed in [40] which uses a high resolution on-chip embedded test structure called a time-to-digital converter (TDC) that provides timing resolution of approximately 25 ps. A novel chip-averaging technique is also devised which reduce the adverse effects of intra-die process variations on HT detection.…”
Section: Path Delay Characterization Basedmentioning
confidence: 99%
“…The efficiency of the method decreases with the increasing number of high fanout nets in the design. A high resolution on-chip embedded test structure called timeto-digital converter (TDC) for measuring path delays and a chip-averaging technique was proposed to detect delay anomalies introduced by HTs in [19]. An on-chip self-referencing based HT detection method was proposed in [16].…”
Section: Related Workmentioning
confidence: 99%
“…Conventional manufacturing VLSI test and verification methodologies fall short in detecting HW Trojans due to the different and un-modeled nature of these malicious alterations. This has led many researchers to investigate solutions for detection of HW Trojans through statistical analysis of side-channel information collected from ICs, including sidechannel power analysis [1]- [6], power supply transient signal analysis [7], [8], regional supply currents analysis [9], temperature analysis [10], wireless transmission power analysis [11], and side-channel delay analysis [12]- [18].…”
Section: Introductionmentioning
confidence: 99%