2010 9th International Symposium on Electronics and Telecommunications 2010
DOI: 10.1109/isetc.2010.5679312
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On Oscillation Based filter testing

Abstract: An analytical method to determine the response of a class of Oscillation Based Test circuits built around second-order filters is presented. It is showed that in the case of a system with real poles the traditional setup for the Oscillation Based Test fails to oscillate. A novel circuit structure with a trigger-Schmidt comparator is proposed that circumvents this limitation.

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Cited by 5 publications
(1 citation statement)
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“…Complex testing systems have limited implementation ability in very large scale integration (VLSI) circuits, due to the large number of circuits to be tested and limited free chip area for test systems. Another approach for testing parametric faults in analog or mixed circuits are oscillation-based BIST systems [5][6][7][8]. The main idea for oscillation-based testing is to convert CUT to an oscillator, whose frequency of oscillation is known.…”
Section: Oscillation Based Bist Implementationmentioning
confidence: 99%
“…Complex testing systems have limited implementation ability in very large scale integration (VLSI) circuits, due to the large number of circuits to be tested and limited free chip area for test systems. Another approach for testing parametric faults in analog or mixed circuits are oscillation-based BIST systems [5][6][7][8]. The main idea for oscillation-based testing is to convert CUT to an oscillator, whose frequency of oscillation is known.…”
Section: Oscillation Based Bist Implementationmentioning
confidence: 99%