On primitive fault test generation in non-scan sequential circuits

Abstract

A method is presented for identifying primitive path-delay faults in non-scan sequential cixuits and generating robwt tests for all robustly testable primitive faults. It uses the concept of sensitizing cubes introduced in an earlier paper and a nw, more eficient algon.thmfor generating them. Sensitizing cubes of the natstate and output logic are used to obtain static sensitizing vectors that can be applied to the non-scan sequential cixuit as part of a vector-paiz These vector-pairs are also used in den.ving robust tests. Initializing sequencesfim a reset state and sequences that propagate fault effects~m @p-@ps to pn.nra~outputs are also generated The proposed method has been implemented and used to derive testsforprimitivefaults in ISCAS'89 and MCNC'91 benchmark cixuits.