This paper studies one-dimensional Ornstein-Uhlenbeck processes, with the
distinguishing feature that they are reflected on a single boundary (put at
level 0) or two boundaries (put at levels 0 and d>0). In the literature they
are referred to as reflected OU (ROU) and doubly-reflected OU (DROU)
respectively. For both cases, we explicitly determine the decay rates of the
(transient) probability to reach a given extreme level. The methodology relies
on sample-path large deviations, so that we also identify the associated most
likely paths. For DROU, we also consider the `idleness process' $L_t$ and the
`loss process' $U_t$, which are the minimal nondecreasing processes which make
the OU process remain $\geqslant 0$ and $\leqslant d$, respectively. We derive
central limit theorems for $U_t$ and $L_t$, using techniques from stochastic
integration and the martingale central limit theorem