2012
DOI: 10.1016/j.tsf.2012.05.004
|View full text |Cite
|
Sign up to set email alerts
|

On the effect of water and oxygen in chemical vapor deposition of boron nitride

Abstract: close to stoichiometric, although containing a few atomic percent oxygen and hydrogen, Xray diffraction measurements show no indications for nucleation of any crystalline BN phases, despite change in N/B-ratio and/or process temperature. Thermodynamic modeling suggests that this is due to formation of strong B-O bonds already in the gas phase in the presence of water or oxygen during growth. This growth behavior is believed to be caused by an uncontrolled release of water and/or oxygen in the deposition chambe… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

3
8
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
6
1
1

Relationship

2
6

Authors

Journals

citations
Cited by 15 publications
(11 citation statements)
references
References 21 publications
(27 reference statements)
3
8
0
Order By: Relevance
“…The determined distance d000ℓ = 3.37 Å is larger than the value reported for films deposited from B2H6 19 and BCl3 29 at 1200 °C (d000ℓ = 3.34 Å). It is, however, closer to that of h-and r-BN than the value d000ℓ = 3.5 Å previously determined for as-deposited t-BN films grown from borazine at 900 °C 27 and from TEB and NH3 at 1200 °C 25 . In addition, XRD shows that our t from borazine and BCl3.…”
Section: Resultssupporting
confidence: 58%
See 1 more Smart Citation
“…The determined distance d000ℓ = 3.37 Å is larger than the value reported for films deposited from B2H6 19 and BCl3 29 at 1200 °C (d000ℓ = 3.34 Å). It is, however, closer to that of h-and r-BN than the value d000ℓ = 3.5 Å previously determined for as-deposited t-BN films grown from borazine at 900 °C 27 and from TEB and NH3 at 1200 °C 25 . In addition, XRD shows that our t from borazine and BCl3.…”
Section: Resultssupporting
confidence: 58%
“…Depositions performed below 1000 °C on Si, with several boron precursors such as diborane (B2H6) [18][19][20][21][22][23] , decaborane (14) (B10H14) 24 , triethylboron (TEB, B(C2H5)3) 25 and ammonia (NH3) or with single-source precursors such as ammonia-borane (H3NBH3) 10 and B-trichloroborazine (B3Cl3N3H3) 26 resulted in growth of amorphous BN. Turbostratic BN (t-BN) films was reported at 800 °C from borazine (B3N3H6) 27 , at 980 °C from N-trimethyl borazine (B3H3N3(CH3)3) 28 and at 1200 °C using TEB 25 or BCl3 29 . Polycrystalline films were deposited from B2H6 and NH3 at 1200 °C on Si(100) 19 and nanocrystalline films from TEB and NH3 on Si(111) at 1350 °C 5 .…”
Section: Introductionmentioning
confidence: 99%
“…We showed by thermodynamic calculations that these B-O bonds are formed already in the gas phase. Any oxygen contamination of the growth chamber thus prohibits the growth of high quality BN [12].…”
Section: Growth Results and Xrdmentioning
confidence: 99%
“…But in addition to these two crystals there are also less 8 7 , 3 2 , 3 1 ; 8 3 0, 0, : N 2 1 , 3 2 , 3 1 0; 0, 0, : B c-BN 216 a=3.615Å 4 3 , 4 1 , 4 3 ; 4 1 , 4 3 , 4 3 ; 4 3 , 4 3 , 4 1 ; 4 1 , 4 1 , 4 1 : N 0 , 2 1 , 2 1 ; 2 1 , 0 , 2 1 ; 2 1 , 2 1 , 0 0; 0, 0, : B oxides and hydroxides [11]. t-BN on the other side has some degree of order -basal planes are parallel to each other, but there is no ordering between the basal planes (rotational disorder) and spacing between them is larger than for h-or r-BN and is not well defined [12].…”
Section: Boron Nitridementioning
confidence: 99%
“…To remove water adsorption in the reactor, which is the main source of oxygen that is not desirable to be present in the reactor during growth, the system was evacuated to a vacuum of about 10 -7 mbar prior the growth and during stand-by of the system [11].…”
Section: Reactormentioning
confidence: 99%