2021
DOI: 10.1016/j.microrel.2021.114276
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On the evaluation of FPGA radiation benchmarks

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Cited by 2 publications
(1 citation statement)
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“…The most common procedure for qualifying an FPGA consists of testing each of its elements individually, even though this procedure does not allow the failure rate estimation of the actual application nor the comparison with other FPGA families. In recent works [1][2][3], the authors discuss how to overcome such limitations by using benchmark circuits, improving the qualification process by enabling comparisons of SEE and TID performance between different FPGA technologies. Nonetheless, retrieving the failure rate of an actual application remains a challenging task, particularly for systems involving additional front-end electronics, such as detectors applications.…”
Section: Introductionmentioning
confidence: 99%
“…The most common procedure for qualifying an FPGA consists of testing each of its elements individually, even though this procedure does not allow the failure rate estimation of the actual application nor the comparison with other FPGA families. In recent works [1][2][3], the authors discuss how to overcome such limitations by using benchmark circuits, improving the qualification process by enabling comparisons of SEE and TID performance between different FPGA technologies. Nonetheless, retrieving the failure rate of an actual application remains a challenging task, particularly for systems involving additional front-end electronics, such as detectors applications.…”
Section: Introductionmentioning
confidence: 99%