Proceedings of the 27th Annual ACM Symposium on Applied Computing 2012
DOI: 10.1145/2245276.2231953
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On the improvement of a fault classification scheme with implications for white-box testing

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Cited by 4 publications
(2 citation statements)
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References 13 publications
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“…Pan et al [1] present a catalog of 27 bug fix pattern and a tool to extract instances of them from source code. Nath et al [5] use the patterns to evaluate another Java open source project. However, they mined the pattern instances by hand.…”
Section: Related Workmentioning
confidence: 99%
“…Pan et al [1] present a catalog of 27 bug fix pattern and a tool to extract instances of them from source code. Nath et al [5] use the patterns to evaluate another Java open source project. However, they mined the pattern instances by hand.…”
Section: Related Workmentioning
confidence: 99%
“…Although Pan et al did not use their taxonomy to fix software bugs, the taxonomy has had a significant impact on APR research. Several researchers have improved and extended Pan et al's taxonomy and used it in APR tools [38] [39] [40]. Due to its simplicity, Pan's taxonomy has also been extended to other programming languages, e.g.…”
Section: Derivation Shorthandmentioning
confidence: 99%