2016
DOI: 10.1016/j.actamat.2016.02.038
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On the origin of creep dislocations in a Ni-base, single-crystal superalloy: an ECCI, EBSD, and dislocation dynamics-based study

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Cited by 68 publications
(36 citation statements)
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“…In such a heavily deformed area shown in Figure 1a, the background matrix itself has a large contrast across geometrically necessary dislocations (GNDs; Kaczorowski & Gerberich, 1991), so it is hard to distinguish the dislocation lines clearly like the image shown in Figure 1d. Moreover, based on the crystal orientation analysis, EBSD is limited as only the GND density can be obtained, rather than total dislocation density (Ram et al, 2016;Gutierrez-Urrutia & Raabe, 2012). Through further annealing, the grain grew by the migration of HAGB but no migration of the LAGB occurred (shown in Figure 2b,c).…”
Section: Resultsmentioning
confidence: 99%
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“…In such a heavily deformed area shown in Figure 1a, the background matrix itself has a large contrast across geometrically necessary dislocations (GNDs; Kaczorowski & Gerberich, 1991), so it is hard to distinguish the dislocation lines clearly like the image shown in Figure 1d. Moreover, based on the crystal orientation analysis, EBSD is limited as only the GND density can be obtained, rather than total dislocation density (Ram et al, 2016;Gutierrez-Urrutia & Raabe, 2012). Through further annealing, the grain grew by the migration of HAGB but no migration of the LAGB occurred (shown in Figure 2b,c).…”
Section: Resultsmentioning
confidence: 99%
“…However, it is hard to achieve this condition with non‐single crystal materials because of the principle of formation of electron channeling patterns. It can be achievable if SEM has the ability to collect selected area channeling patterns (SACPs) as the rocking incident beam but most of the latest models no longer have the configuration to provide SACPs (Joy et al, ; Ram et al, ; Mansour et al, ). Therefore, it is necessary to use the orientation information obtained by the EBSD (Gutierrez‐Urrutia, Zaeffere, & Raabe, ; Gutierrez‐Urrutia, Zaeffere, & Raabe, ).…”
Section: Introductionmentioning
confidence: 99%
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“…33 This inclusion was generated as a result of a different processing route, and so the microstructure and properties of this inclusion structure are different than those discussed, as observed in the explicit microstructure rendered for the CPFE study shown in Fig. 8a.…”
Section: Cpfe Model Of Polycrystal Containing Second-phase Particle Fmentioning
confidence: 95%
“…To address this problem, ECCI is a promising technique to be used as an alternative dislocation characterization method to determine the total dislocation density. 32,33 The initial dislocation density was low and homogeneously distributed through the microstructure, and the presence of residual stress gradients was low. 31 After two cycles, the GND density and residual stress gradient ''hot spot'' (red) maps are shown in Fig.…”
Section: Hr-ebsd Study Of Plasticity In Polycrystals Containing a Secmentioning
confidence: 99%