Investigation of the switching phenomenon on TlGaSSe single crystal revealed that it is typical for a memory switch. The switching process takes place with both polarities on the crystal and have symmetrical shapes.Currentvoltage characteristics (CVC) of symmetrical Ag/TlGaSSe/Ag structures exhibit two distinct regions, high resistance OFF state and low resistance ON state having negative dierential resistance. In addition, TlGaSSe is a quarternary semiconductor exhibiting S-type IV characteristics. The experimental results indicate that the phenomenon in our sample is very sensitive to temperature; light intensity and sample thickness. The switching parameters were checked under the inuence of dierent factors of the ambient condition. The present investigation is the rst one on switching phenomenon of TlGaSSe.