On the relation between X-ray small-angle scattering and electrical resistivity

Abstract

A relation between XSAS intensity spectra and electrical resistivity is developed assuming that Ziman's equation holds and the mean value of the square of the Fourier transform of the total scattering potential of the conductivity electrons on the lattice points is proportional to the intensity of the scattered X‐rays as sometimes used for fluids. In the first step this model is extended to pure metals in the solid state (supposing that the Bragg peaks of an ideal lattice do not contribute to resistivity) and transformed from a relation of proportionality into an equation. In the frame of this model the resistivity is proportional n0–8/3 (where n0 the mean value of conductivity electron density). The further considerations show that the formulae valid for pure metals can be extended very easily to multinary alloys replacing n0, pure by n0, alloy = \documentclass{article}\pagestyle{empty}\begin{document}$ \sum\limits_{i = 1}^k {c_i n_0,i}. $\end{document} cin0, i. A first rough comparison of the calculated and experimentally measured resistivities yields the right order of magnitude of the contribution of the GPZ zones to the resistivity.