Sensor pattern noise (SPN) extraction is a critical stage of the sensor based source camera identification (SCI). However, the quality of the extracted SPN with the traditional discrete wavelet transform (DWT) based method is poor around strong edges and along with the image border. To fill this gap, we propose a dual tree complex wavelet transform (DTCWT) based method to extract the SPN from a given image, which achieves better performance in the area around strong edges. Furthermore, symmetric boundary extension instead of the periodized boundary extension is used for enhancing the quality of SPN along with the image border. Extensive experimental results on both synthetic noisy images and real-world photographs clearly demonstrate the superior SCI performance of the proposed method over state-of-the-arts. Moreover, the proposed method also shows potential in the application of image tampering localization. INDEX TERMS Sensor pattern noise, source camera identification, discrete wavelet transform, dual tree complex wavelet transform.