On the synthesis and thermodynamic properties of SrLaGaO4-SrLaAlO4 solid solutions

Novosselov, A.; Зимина, Г. В.; Filaretov, A. A.; Shlyakhtin, O.A.; Комиссарова, Л.Н.; Pajączkowska, A.

doi:10.1016/s0025-5408(01)00659-6

Cited by 16 publications

(11 citation statements)

References 10 publications

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“…Crystals of high structural quality are required for such applications so the characterisation of crystal lattice defects is of great importance. The crystals of solid solution in the systems A x A 0 1Àx BCO 4 or ABC x C 0 1Àx O 4 give the possibility of obtaining the proper lattice parameter by the selection of the A/A 0 or C/C 0 ratio [8][9][10][11]. The linearity of lattice parameters a and c for the whole concentration range x (0pxp1) in solid solutions of SrLaAlO 4 -CaLaAlO 4 , SrNdAlO 4 -CaNdAlO 4 , SrPrAlO 4 -CaPrAlO 4 , SrLaAlO 4 -SrLaGaO 4 and SrLaAlO 4 -SrLaFeO 4 was shown by Novoselov et al [11].…”

Section: Introductionmentioning

confidence: 99%

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Malinowska¹,

Lefeld‐Sosnowska²,

Wieteska³

et al. 2008

Journal of Crystal Growth

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a b s t r a c tA Ca 0.5 Sr 0.5 NdAlO 4 single crystal grown by the Czochralski method in the [1 0 0] direction was investigated by means of conventional projection X-ray topography, and by means of synchrotron white beam and monochromatic beam topography.The topographic investigation revealed growth striations with strong black diffraction contrasts distributed periodically in the form of concentric rings, and a significant number of resolved defects. Some of these defects seem to be associated with precipitates, while others form linear diffraction contrasts located perpendicularly to the striation stripes. The last category of defects can be somehow associated with dislocations, but provides much more intense and complex diffraction contrast that can be expected for individual dislocations.A significant lattice deformation associated with striation was revealed with some of the synchrotron topographic methods, particularly back-reflection white beam topography with fine mesh placed behind the crystal and transmission synchrotron section topography, where a characteristic bending of the section image was observed. The transmission section topographs provided also good visibility of segregation fringes in the plane intersected by the beam, corresponding to the subsequent positions of the growth surface.

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Section: Introductionmentioning

confidence: 99%

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Malinowska¹,

Lefeld‐Sosnowska²,

Wieteska³

et al. 2008

Journal of Crystal Growth

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“…Lanthanide oxide materials (Ln = La, Pr and Nd) have shown promise due to lattice matching and have been employed as the substrate layers. There have been numerous studies on their morphology, structural, thermodynamic, magnetic, elastic properties and crystal growth [3,4]. Even more attention is paid to multilayered structures consisting of several various metallic oxides.…”

Section: Introductionmentioning

confidence: 99%

Investigation of epitaxial LaNiO3−x thin films by high-energy XPS

Mickevičius¹,

Grebinskij²,

Bondarenka³

et al. 2006

Journal of Alloys and Compounds

195

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Epitaxial thin films of LaNiO 3−x were deposited by using a reactive d.c. magnetron sputtering technique. High-energy X-ray photoelectron spectroscopy was used to analyze the composition and valence states of La and Ni in the films after long time aging in atmosphere. The obtained results show the existence lanthanum and nickel in oxide and hydroxide chemical states. The oxygen exists in four chemical states: lattice oxides, hydroxyl groups and in adsorbed water. Comparison of the spectra recorded at normal emission and grazing emission angle revealed that the hydroxyl group's concentration is mostly present at the surface of the film.

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“…The interest in this material stems from its crystal structure, lattice constant and dielectric properties (2)(3)(4). It has a tetragonal structure that belongs to the space group D 4h , similar to that of K 2 NiF 4 .…”

Section: Introductionmentioning

confidence: 99%

The distances of Co–O band in SrLaAlO₄: Co²⁺crystal

Zeng

Zhao

Zhu

et al. 2008

Radiation Effects and Defects in Solids

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Based on Zhao's semi-SCF d-orbit wave functions model of free Co 2+ ions, the superposition crystal field model and Macfarlane's perturbation loop method, the distances of the Co-O band in a SrLaAlO 4 :Co 2+ crystal were determined by calculating the experimental optical spectra and EPR parameter. The agreement between the calculated result and the experimental data showed quantitatively that Co-O distances perpendicular to and parallel with the C 4 axis were 0.1892 and 0.2139 nm, respectively.

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On the synthesis and thermodynamic properties of SrLaGaO4-SrLaAlO4 solid solutions

Cited by 16 publications

References 10 publications

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Investigation of epitaxial LaNiO3−x thin films by high-energy XPS

The distances of Co–O band in SrLaAlO₄: Co²⁺crystal

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On the synthesis and thermodynamic properties of SrLaGaO4-SrLaAlO4 solid solutions

Cited by 16 publications

References 10 publications

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Investigation of epitaxial LaNiO3−x thin films by high-energy XPS

The distances of Co–O band in SrLaAlO4: Co2+crystal

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The distances of Co–O band in SrLaAlO₄: Co²⁺crystal