2013
DOI: 10.1016/j.nimb.2013.05.008
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On the use of SRIM for computing radiation damage exposure

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Cited by 1,271 publications
(410 citation statements)
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“…The polished surface of the bars were then proton-irradiated at the Michigan Ion Beam Laboratory's 1.7 MeV Tandertron accelerator facility at 2 MeV and 350 ±9 °C to doses of 2.3, 4.7 and 7.0 displacements per atom (dpa) at a current of ~0.2 μA mm -2 , resulting in a damage rate ~6.7 x10 -6 dpa s -1 . The proton irradiation dose (dpa) level was calculated at 60% of the maximum proton penetration depth, 30 μm, calculated by the quick Kinchin-Pease calculation in SRIM as recommended by Stoller et al [26]. As such, TEM foils were prepared for examination at this depth by carefully grinding from the non-irradiated face to a thickness of ~160 μm and then electropolishing using a twin-jet Tenupol-5 electropolisher together with a Julabo FP50 cooling unit.…”
Section: Methodsmentioning
confidence: 99%
“…The polished surface of the bars were then proton-irradiated at the Michigan Ion Beam Laboratory's 1.7 MeV Tandertron accelerator facility at 2 MeV and 350 ±9 °C to doses of 2.3, 4.7 and 7.0 displacements per atom (dpa) at a current of ~0.2 μA mm -2 , resulting in a damage rate ~6.7 x10 -6 dpa s -1 . The proton irradiation dose (dpa) level was calculated at 60% of the maximum proton penetration depth, 30 μm, calculated by the quick Kinchin-Pease calculation in SRIM as recommended by Stoller et al [26]. As such, TEM foils were prepared for examination at this depth by carefully grinding from the non-irradiated face to a thickness of ~160 μm and then electropolishing using a twin-jet Tenupol-5 electropolisher together with a Julabo FP50 cooling unit.…”
Section: Methodsmentioning
confidence: 99%
“…DPA was calculated using the method proposed by Stoller et al [17] using a displacement energy for W of 90 eV [18]. Samples were irradiated using 15 or 60 keV He + ions to achieve He-appm/DPA ratios of ~40,000 and ~2,000, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…The temperature of the specimens did not increase obviously during ion irradiation by controlling the ion beam intensity (<1 µA). The damage profiles were calculated using the software SRIM 2008, 11,12) as shown in Fig. 1, wherein the displacement energy (E dis ) is 40 eV.…”
Section: Materials and Experimental Proceduresmentioning
confidence: 99%