2021
DOI: 10.1016/j.nimb.2021.06.018
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On the use of SRIM for calculating vacancy production: Quick calculation and full-cascade options

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Cited by 98 publications
(20 citation statements)
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“…In all experiments SRIM has been used in the Kinchin-Pease (KP) mode, to calculate the total fluence needed to reach a certain dpa value [ 26 , 27 , 28 ]. The other parameter needed is the displacement energy of the material [ 16 ] taken from tabulated values [ 8 ], or agreed with the user.…”
Section: Methodsmentioning
confidence: 99%
“…In all experiments SRIM has been used in the Kinchin-Pease (KP) mode, to calculate the total fluence needed to reach a certain dpa value [ 26 , 27 , 28 ]. The other parameter needed is the displacement energy of the material [ 16 ] taken from tabulated values [ 8 ], or agreed with the user.…”
Section: Methodsmentioning
confidence: 99%
“…1 gives the depth-dependent distribution of irradiation dose and injected ion concentration predicted using SRIM-2013 for the 0.37 dpa midrange dose condition. The calculation was performed using the full-cascade mode and damage energy method with the displacement energy of Fe set to 40 eV [43] (the results are com-pared to the Kinchin-Pease Quick Calculation mode in Section 1 of the Supplementary). The analysis region was taken from the mid-range (depth ∼1 μm) as denoted in the figure to minimize the po- tential anomalous contributions from both the surface and injected ions [44].…”
Section: Ion Irradiation Experimentsmentioning
confidence: 99%
“…Fig. 1 shows the displacement damage profile (in displacements per atom, or dpa) for W ions implanted into W. The data points shown were obtained from SRIM via the so-called Kinchin-Pease "quick" calculation (as recommended in [60,61]). For ion energies of 10, 20 and 50 MeV, the implantation of 10000 W ions were simulated and the resulting vacancies/ion as a function of depth into the sample were used to calculate the dpa for an incident ion fluence of 10 14 ions/cm 2 , which is typical of low-dpa ion-irradiation experiments (see, for example, table S1 in the supplemental material of [25]).…”
Section: Elastic Stress In An Ion-irradiated Thin Filmmentioning
confidence: 99%