2006
DOI: 10.1103/physrevlett.96.136104
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One-Dimensional Surface Reconstruction as an Atomic-Scale Template for the Growth of Periodically Striped Ag Films

Abstract: The role of the In/Si(111)-(4 x 1)-In surface as an atomic-scale geometrical template for the growth of Ag thin films is clarified by scanning tunneling microscopy and low energy electron diffraction. Low-temperature grown Ag films are found to have stripe structures with a transverse periodicity equal to that of indium chains of the In/Si(111)-(4 x 1)-In. The stripes exhibit a structural transformation at the thickness of 6 monolayers (ML); this relaxation allows the stripes to persist up to a thickness as la… Show more

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Cited by 22 publications
(43 citation statements)
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“…1(b)) 13 . The film surface consists of Ag(111) nano-planes with periodic insertion of SF planes at every five layers.…”
Section: Introductionmentioning
confidence: 99%
“…1(b)) 13 . The film surface consists of Ag(111) nano-planes with periodic insertion of SF planes at every five layers.…”
Section: Introductionmentioning
confidence: 99%
“…Ag films with a high density of stacking fault planes were prepared by low-temperature (LT) ($ 100 K) deposition on Si(111)-(4 Â 1)-In substrates followed by a natural annealing to room temperature (RT). 16,21 Subsequently, the Au films were grown at 100 K on the Ag templates and kept at RT for 12 h to obtain large Au terraces. All the spectroscopic measurements were performed at the sample temperature below 8 K. W tips used in the experiment were prepared by flashing and Ar þ ion bombardment.…”
mentioning
confidence: 99%
“…Ag films about 20 monolayers (ML) in thickness were grown on In4×1 around 100 K followed by a natural annealing to room temperature. This results in penetration of high-density SF planes into the film, which are terminated by 'fractional' steps with a height of 0.078 nm (equivalent to 1/3 of the MA step height) [21]. Figure 1 (a)(b) show a typical STM image of a Ag(111) film with SF step arrays and a tilt-corrected height profile taken along the dashed line (z: height, x: lateral distance).…”
mentioning
confidence: 99%
“…To determine the reflection amplitude and the phase shift, sufficiently long and straight SF steps are needed. For this aim, Si(111)4×1-In surfaces (referred to as In4×1) were used as one-dimensional (1D) atomic-scale geometric templates [17,18,21]. Ag films about 20 monolayers (ML) in thickness were grown on In4×1 around 100 K followed by a natural annealing to room temperature.…”
mentioning
confidence: 99%