Abstract:Abstract:In this contribution, we present a wavelength-sensitive method for the detection of extreme ultraviolet (XUV) photon energies between 30 eV and 120 eV. The method is based on 45 • reflectivity from either a cesium iodide-coated or an uncoated metal surface, which directs the XUV beam onto an electron or ion detector and its signal is used to monitor the XUV beam. The benefits of our approach are a spectrally sensitive diagnosis of the XUV radiation at the interaction place of time-resolved XUV experim… Show more
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