Open NSO Modeling for DFM

Wang, Junping; Pan, Ning; Wang, Le; Su, Yongbang; Liu, Shigang; Wan, Guoting; Wang, Song

doi:10.1109/iciecs.2010.5677810

Cited by 3 publications

(7 citation statements)

References 14 publications

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“…An open sensitivity model based on the mathematical morphology is proposed in Ref. [38], which considers the probability of an open circuit fault on each net in a layout, and its algorithm is designed and implemented. For a special layout layer, let N m be a set of the nets, M be the number of the nets, N m i be the arbitrary net, F be the sets of defect on the layer, D.X c ,Y c / be an arbitrary defect and D.X c ,Y c / 2 F. The open circuit sensitivity model is expressed by…”

Section: Open Sensitivity Model Based On Per Unit Netmentioning

confidence: 99%

“…In Ref. [38], we have proposed a novel NSO (Net Sensitivity for Opens) model, which is to extract the optimal positions. In practical application, the NSO model can choose the nets to be optimized in theory, but we find that it cannot achieve the desired effect for the nets to be optimized due to the limitations of the layout placement in some special conditions.…”

Section: Introductionmentioning

confidence: 99%

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A new sensitivity model with blank space for layout optimization^*

Wang

Liu

et al. 2017

J. Semicond.

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As the technology scales advancing into the nanometer region, the concept of yield has become an increasingly important design metric. To reduce the yield loss caused by local defects, layout optimization can play a critical role. In this paper, we propose a new open sensitivity-based model with consideration of the blank space around the net, and study the corresponding net optimization. The proposed new model not only has a high practicability in the selection of nets to be optimized but also solves the issue of the increase in short critical area brought during the open optimization,which means to reduce the open critical area with no new short critical area produced, and thereby this model can ensure the decrease of total critical area and finally achieves an integrative optimization. Compared with the models available, the experimental results show that our sensitivity model not only consumes less time with concise algorithm but also can deal with irregular layout, which is out of the scope of other models. At the end of this paper, the effectiveness of the new model is verified by the experiment on the randomly selected five metal layers from the synthesized OpenSparc circuit layout.

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Section: Open Sensitivity Model Based On Per Unit Netmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A new sensitivity model with blank space for layout optimization^*

Wang

Liu

et al. 2017

J. Semicond.

View full text Add to dashboard Cite

show abstract

“…A sensitivity model for short nets based on the basic information of layouts was proposed in Ref. [39], in which the defects approximate the circular ones, and the nets are similar to the rule rectangle. The maximal size of defects of m channels in the model is given as follows:…”

Section: Sensitivity Model For Short Nets Based On the Basic Informat...mentioning

confidence: 99%

“…In order to analyze the performance of this optimization method more intuitively, the optimization method in this paper is compared with previous optimization methods used in Refs. [13] and [39]. Our optimization method based on NSS sensitivity has the following advantages: i) NSS can reflect the true shape of the defects and nets, and size and spatial distributions of the defects, which supports a wider and more accurate optimization; ii) sensitivity calculations take into account the probability that a single net becomes short with other nets all around it.…”

Section: Performance Analysismentioning

confidence: 99%

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A novel sensitivity model for short nets

Liu¹,

Wang²,

Su³

et al. 2012

Chinese Phys. B

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For modern processes at deep sub-micron technology nodes, yield design, especially the design at the layout stage is an important way to deal with the problem of manufacturability and yield. In order to reduce the yield loss caused by redundancy material defects, the choice of nets to be optimized at first is an important step in the process of layout optimization. This paper provides a new sensitivity model for a short net, which is net-based and reflects the size of the critical area between a single net and the nets around it. Since this model is based on a single net and includes the information of the surrounding nets, the critical area between the single net and surrounding nets can be reduced at the same time. In this way, the efficiency of layout optimization becomes higher. According to experimental observations, this sensitivity model can be used to choose the position for optimization. Compared with the chip-area-based and basiclayout-based sensitivity models, our sensitivity model not only has higher efficiency, but also confirms that choosing the net to be optimized at first improves the design.

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Net sensitivity for open and short model based on layout optimization

Wang¹,

Su-Yang²,

Liu³

2014

Acta Phys. Sin.

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To maintain and improve the manufacturing yield of integrated circuit becomes a research hot spot in optimized circuit design and manufacturing technology, with the expansion of the integrated circuit scale and shrinkage of devices feature sizes. In order to reduce the yield loss caused by redundancy material defect and missing material defect, choosing a preferentially optimizing net becomes an important subject in the process of layout optimization. Layout optimization is an effective way to increase integrated circuit yield which is based on the critical area diminution. In the paper presented is a new kind of short circuit and open circuit sensitivity model, which is net-based and not only reflects the size of the short critical area between the single net and the nets around it, but also possesses open critical area. Because this model is based on single net and includes the information about the surrounding net, the short critical area between the single net and the net around it and the open critical area of its own can be reduced at the same time. In this way, the efficiency of layout optimization is enhanced. According to the experimental results, this sensitivity model can be used to choose the position for optimization.

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Open NSO Modeling for DFM

Cited by 3 publications

References 14 publications

A new sensitivity model with blank space for layout optimization^*

A new sensitivity model with blank space for layout optimization^*

A novel sensitivity model for short nets

Net sensitivity for open and short model based on layout optimization

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Open NSO Modeling for DFM

Cited by 3 publications

References 14 publications

A new sensitivity model with blank space for layout optimization*

A new sensitivity model with blank space for layout optimization*

A novel sensitivity model for short nets

Net sensitivity for open and short model based on layout optimization

Contact Info

Product

Resources

About

A new sensitivity model with blank space for layout optimization^*

A new sensitivity model with blank space for layout optimization^*