2023
DOI: 10.1007/s10853-023-08547-8
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Optical and electronic transport properties of epitaxial InGaAs and InAlAs in multilayer stacks

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Cited by 3 publications
(1 citation statement)
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“…The resulting leakage current density attributed to this phenomenon is denoted as Poole-Frenkel leakage current, expressed by equation (5). where C PF is a constant, E is the electric field across the barrier, f t is the barrier height for the electron emission from the trap state, ε 0 is the permittivity of vacuum, and ε S is the relative permittivity of the InAlAs barrier at high frequencies [38].…”
Section: Gate Leakage Modelling and Analysismentioning
confidence: 99%
“…The resulting leakage current density attributed to this phenomenon is denoted as Poole-Frenkel leakage current, expressed by equation (5). where C PF is a constant, E is the electric field across the barrier, f t is the barrier height for the electron emission from the trap state, ε 0 is the permittivity of vacuum, and ε S is the relative permittivity of the InAlAs barrier at high frequencies [38].…”
Section: Gate Leakage Modelling and Analysismentioning
confidence: 99%