2013
DOI: 10.1155/2013/545076
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Optical and Structural Properties of Titanium Dioxide Films from and Starting Materials Annealed at Various Temperatures

Abstract: We investigated the optical and structural properties of titanium dioxide films deposited from and starting materials by electron beam evaporation at annealing temperatures from to . We find that the refractive index of as-deposited films from starting material is higher than that of as-deposited films from starting material. In addition, during thermal annealing, the refractive index fluctuates slightly as compared with films from starting material. This should be attributed to the fact that the deposited mol… Show more

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Cited by 17 publications
(7 citation statements)
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“…The E g values obtained were 3.54 eV (sample S1) and 3.64 eV (sample S2) [ 9 ]. This blue-shift of 0.10 eV observed in sample S2 can be attributed to a combination of two effects: (i) the scattering losses because of its rougher surface, and (ii) the possible higher number of oxygen defects/vacancies created during the growth as consequence of the slower deposition rates [ 37 ]. While in the proof-of-concept cells fabricated in this work the TiO 2 layers were deposited on the back contact, this tuning of band gap could be very beneficial for the design of rear-emitter solar cells.…”
Section: Resultsmentioning
confidence: 99%
“…The E g values obtained were 3.54 eV (sample S1) and 3.64 eV (sample S2) [ 9 ]. This blue-shift of 0.10 eV observed in sample S2 can be attributed to a combination of two effects: (i) the scattering losses because of its rougher surface, and (ii) the possible higher number of oxygen defects/vacancies created during the growth as consequence of the slower deposition rates [ 37 ]. While in the proof-of-concept cells fabricated in this work the TiO 2 layers were deposited on the back contact, this tuning of band gap could be very beneficial for the design of rear-emitter solar cells.…”
Section: Resultsmentioning
confidence: 99%
“…Details of Ti 2p, O 1s, and N 1s peaks in amorphous N-TiO 2 XPS spectra at 200 °C are summarized in Table 1. The peaks at 461.5 (Ti 2p 3/2 ) and 455.9 (Ti 2p 1/2 ) eV in the XPS spectra correspond to Ti 4+ and Ti 3+ ions, respectively [75,76,77]. …”
Section: Resultsmentioning
confidence: 99%
“…Using a Ti 3 O 5 tablet as a starting material, we then performed e-beam evaporation at a working pressure of approximately 0.1 Torr to produce TiO 2 films with thicknesses of 10 nm, 20 nm, 30 nm, and 40 nm. The reaction equation is as follows [30,31]:2Ti3O5+O26TiO2…”
Section: Methodsmentioning
confidence: 99%