Organic–inorganic
perovskite solar cells (PSCs), which have
good environmental durability, are of great interest for practical
applications. In this work, we show that a solution-processed MoO
x
layer acts as a buffer layer against high
moisture stress to suppress defects in the perovskite and as a hole
transport layer. The inversion of the photoinduced charge migration
behaviors, that is, the electron preferentially moving toward the
surface when MoO
x
is directly deposited
onto the perovskite, is found to cause a significant loss in device
functionality. The deposition of MoO
x
onto
spiro-OMeTAD results in a lower photocurrent density–voltage
(J–V) hysteresis behavior,
a greatly enhanced electrical conductivity, and a significantly stabilized
power conversion efficiency (PCE) when compared with those of devices
without the MoO
x
layer. More importantly,
the PCEs of the MoO
x
-based devices are
retained at over 85% of their initial value, while only 75% is retained
for a reference cell. This work highlights the facial fabrication
approach of the solution-based MoO
x
layer
and provides experimental evidence of the photogenerated charge migration
behaviors on the perovskite/MoO
x
interface.
This information would be beneficial for the further design and development
of PSC technology.