Optical constants of Ni nanofilms

Grigor’eva, T. I.; Khasanov, T. Kh.

doi:10.1134/s0030400x12050050

Cited by 4 publications

(2 citation statements)

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“…(iv) To investigate the optical properties of metal or semiconductor films that instantaneously oxidize in air atmosphere, one can use a plane-parallel plate made of fused quartz, with the surfaces of the plate being thoroughly polished (e.g., as in [12,13]). For these plane-parallel plates, the possibility of occurrence of a surface layer can be neglected.…”

Section: Discussionmentioning

confidence: 99%

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Values of the refractive index of bulk quartz

Khasanov

2015

Opt. Spectrosc.

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We have considered some well-known methods of measuring the refractive index in order to determine how the surface layer affects measurement results. We have proposed a new and relatively simple method in which the surface layer contributes considerably less to the formation of the resultant beam than the bulk material. This method makes it possible to more correctly determine values of the refractive indices of a bulk material. With this method, one can determine not only the relative value of the refractive index but also its absolute value. We have shown that quartz can be efficiently used as a substrate in the ellipsometric determination of optical constants of metal, semiconductor, and dielectric films. Our results are very important for research on the physicochemical properties of metal or semiconductor films rapidly oxidizing in air atmosphere.

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Section: Discussionmentioning

confidence: 99%

“…Both crystalline and fused quartz proved to be well suited for use as substrates in investigations of optical properties of metal and oxide films [12][13][14][15][16]. These materials are transparent in a wide wavelength range [8][9][10].…”

Section: Introductionmentioning

confidence: 99%