Optical-force-induced artifacts in scanning probe microscopy

Kohlgraf-Owens, Dana C.; Sukhov, Sergey; Dogariu, Aristide

doi:10.1364/ol.36.004758

Cited by 14 publications

(13 citation statements)

References 12 publications

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“…The final contrast of this image is a complex convolution of topography and optical properties including local and propagating plasmons of the surface. It needs to be said that several studies have shown that the interpretation of a SNOM image is indeed far from obvious and that knowledge of even hardly accessible local materials parameters is required to avoid ambiguities 31,32 . The most common artifact is induced by the strong dependence of the signal on the tip-sample distance.…”

Section: Figure 2: A) Luminescence From the Apex Of The Gold Tip B) mentioning

confidence: 99%

A near field optical image of a gold surface: a luminescence study

Merlen

Plathier

Ruediger

2015

Phys. Chem. Chem. Phys.

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This paper addresses recent experimental findings about luminescence of a gold tip in near-field interaction with a gold surface. Our electrochemically etched gold tips show a typical, intrinsic luminescence that we exploit to track the plasmon resonance modeled by a Lorentzian oscillator. Our experimental device is based on a spectrometer optically coupled to an atomic force microscope used in tuning fork mode. Our measurements provide evidence of a strong optical coupling between the tip and the surface. We demonstrate that this coupling strongly affects the luminescence (Intensity, wavelength and FHWM) as a function of the tip position in 2D maps. The fluctuation of these parameters is directly related to the plasmonic properties of the gold surface and is used to qualify the optical near field enhancement (which subsequently plays the predominant role in surface enhanced spectroscopies) with a very high spatial resolution (typically around 20 nm). We compare these findings to the independently recorded near-field scattered elastic Rayleigh signal.

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Section: Figure 2: A) Luminescence From the Apex Of The Gold Tip B) mentioning

confidence: 99%

A near field optical image of a gold surface: a luminescence study

Merlen

Plathier

Ruediger

2015

Phys. Chem. Chem. Phys.

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“…In addition, it is absolutely necessary to check that the detected anharmonic signal does not come from pure mechanical artifacts (tip touching the surface in tapping mode, non-harmonic tip surface interaction). 74 The second method for background suppression is based on the use of an interferometric scheme. It has been shown that in a-SNOM the final image is the result of a subtle combination of various interferometric signals.…”

Section: Fig 2 (A) (A) Uv (364 Nm) Aperture Near-field Images Of Anmentioning

confidence: 99%

Imaging the Optical near Field in Plasmonic Nanostructures

Merlen

Lagugné‐Labarthet

2014

Appl Spectrosc

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Over the past five years, new developments in the field of plasmonics have emerged with the goal of finely tuning a variety of metallic nanostructures to enable a desired function. The use of plasmonics in spectroscopy is of course of great interest, due to large local enhancements in the optical near field confined in the vicinity of a metal nanostructure. For a given metal, such enhancements are dependent on the shape of the structure as well as the optical properties (wavelength, phase, polarization) of the impinging light, offering a large degree of control over the optical and spatial localization of the plasmon resonance. In this focal point, we highlight recent work that aims at revealing the spatial position of the localized plasmon resonances using a variety of optical and non-optical methods.

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“…This can, for example, be seen in Figure 5 [69]. To significantly reduce the thermal influences, this measurement was performed with an uncoated dielectric probe scanned across a structured dielectric gallium phosphide sample.…”

Section: Steady-state Oifmentioning

confidence: 99%

Optically induced forces in scanning probe microscopy

et al. 2014

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Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

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Optical-force-induced artifacts in scanning probe microscopy

Cited by 14 publications

References 12 publications

A near field optical image of a gold surface: a luminescence study

A near field optical image of a gold surface: a luminescence study

Imaging the Optical near Field in Plasmonic Nanostructures

Optically induced forces in scanning probe microscopy

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