2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts 2009
DOI: 10.1109/holm.2009.5284391
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Optical Investigations of High-Current Vacuum Arc Behavior on Spiral-Shaped and Cup-Shaped RMF-Contacts

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Cited by 21 publications
(5 citation statements)
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“…It can be seen that the transition gap distances for spiral‐type I and wan‐type contacts were in the range of 2.5–4.5 mm, but at 12–13 kA, the transition gap distances were slightly larger. This was basically consistent with the critical gap distance of arc movement (2–4 mm) observed in the related literature . However, the transition gap distance of spiral‐type II contacts was in the range of 4.1–5.6 mm, which is higher than the transition gap distance of the other two contacts.…”
Section: Resultssupporting
confidence: 91%
“…It can be seen that the transition gap distances for spiral‐type I and wan‐type contacts were in the range of 2.5–4.5 mm, but at 12–13 kA, the transition gap distances were slightly larger. This was basically consistent with the critical gap distance of arc movement (2–4 mm) observed in the related literature . However, the transition gap distance of spiral‐type II contacts was in the range of 4.1–5.6 mm, which is higher than the transition gap distance of the other two contacts.…”
Section: Resultssupporting
confidence: 91%
“…These contacts are relatively flat and are subjected to high, closed contact forces. It has been observed that when these contacts open two or more parallel arcs form before they coalesce into one arc as the contacts open further [4,5,6,7,8]. In fact, one experimental, vacuum interrupter, contact structure [9] shows up to 7 parallel arcs forming as the contacts open, see Fig.…”
Section: Discussionmentioning
confidence: 99%
“…The evidence that multiple regions of contact exist when the large area vacuum interrupter contacts come together has existed for more than a quarter of a century [4][5][6][7][8][9]. Even so, there has been no discussion of the implication of this fact to the design of the vacuum circuit breaker (VCB).…”
Section: The Relevance Of Multiple Regions Of Contact In the Developmmentioning
confidence: 99%
“…However, the influence of arc appearance, arc voltage and current on this stage was not studied. Some investigations [11,14] also found that a multi-column appeared between the TMF contacts, but did not give an explanation. The objective of the present research was to determine the arc characteristics during the instability stage and the influence of current.…”
Section: Introductionmentioning
confidence: 97%