Optical Properties and Surface Morphology of Thin Silver Films Deposited by Thermal Evaporation

Zhou, Ming; Li, Yaopeng; Zhou, Sheng; Liu, Dingquan

doi:10.1088/0256-307x/32/7/077802

Cited by 17 publications

(13 citation statements)

References 19 publications

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“…48 In addition, it has been demonstrated in the past that the conditions of Al layer deposition using different procedures can have a significant impact on the dielectric function of the film because they can change the usual grain size over a large range (about 10-50 nm). [49][50][51] Among the observed points, layers with compositions x = 0.40, 0.45, and 0.50 show the most distinctive properties, according to the measured psi-spectra and the findings from the optical analysis. Dielectric functions in this x-range were either described by a single Drude-oscillator (x ≈ 0.4) or by a Drude-Gauss method (x ≈ 0.45, 0.50).…”

Section: Resultsmentioning

confidence: 80%

Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry

Mukherjee

Kalas²,

Burger³

et al. 2023

Photonic Instrumentation Engineering X

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Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschmann-Raether configuration for biosensing applications. The interface layers support two purposes simultaneously: (i) chemical suitability for the adsorption of molecules to be detected and (ii) the optical enhancement of the signal to increase the sensitivity. Ellipsometry is not only used as a sensor but also as a quantitative measurement tool to study and understand the interface phenomena, and to develop the sensing layers for the largest possible optical sensitivity. Plasmonic and structured layers are of primary importance in terms of optical sensitivity. Layers structured both in lateral and vertical directions have been studied. Optical models based on both the transfer matrix and the finite element method were developed and used for the structural analysis where the material and geometrical derivatives are used in the inverse fitting process of the model data to the measurement. Structures utilizing plasmonic, diffraction, multilayer field enhancement, and other methods were analyzed as possible candidates for the improvement of the optical performance of the cell. Combinatorial and periodic plasmonic surface structures were developed to enhance the sensitivity of in-situ ellipsometry at solid-liquid interfaces utilizing the Kretschmann-Raether (KR) geometry. Ag x Al 1−x layers with variable compositions and Au layers with changing periods and critical dimensions were investigated to improve the performance of sensors based on the KR arrangement.

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Section: Resultsmentioning

confidence: 80%

Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry

Mukherjee

Kalas²,

Burger³

et al. 2023

Photonic Instrumentation Engineering X

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“…The tunneling coefficient Ω is well known to describe the energy transfer behavior between two dots, which can be flexibly tuned by applying an external bias voltage to the two dots. [45,52] As a result, in this proposed DQD photocell model, the applied bias voltage may be suggested to overcome the passive influence generated by the gap difference ε. Actually, these findings may explain why no significant quantum fluctuation effect has been observed in macroscopic DQD photovoltaic cells thus far.…”

Section: (A) With Figs 3(b)-3(d)mentioning

confidence: 99%

Delayed response to the photovoltaic performance in a double quantum dots photocell with spatially correlated fluctuation

Zhu¹,

Zhao²,

Xu³

et al. 2023

Chinese Phys. B

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A viable strategy for enhancing photovoltaic performance is to comprehend the underlying quantum physical regime of charge transfer in a double quantum dot (DQD) photocell. This work explores the photovoltaic performance dependent spatially correlated fluctuation in a DQD photocell. The effects of spatially correlated fluctuation on charge transfer and output photovoltaic efficiency was explored in a proposed DQD photocell model. The results revealed that the charge transport process and the time to peak photovoltaic efficiency were both significantly delayed by the spatially correlated fluctuation, while the anti-spatially correlated fluctuation reduced the output peak photovoltaic efficiency. Further results revealed that the delayed response could be suppressed by gap difference and tunneling coefficient within two dots. Subsequent investigation demonstrated that the delayed response was caused by the spatial correlation fluctuation which slowed the generative process of noise-induced coherence, which had previously been proven to improve quantum photovoltaic performance in quantum photocells. And the reduced photovoltaic properties were verified by the damaged noise-induced coherence owing to the anti-spatial correlation fluctuation and a hotter thermal ambient environment. The discovery of delayed response generated by the spatially correlated fluctuations will deepen understanding of quantum features of electron transfer, as well as promises to take our understanding even further concerning quantum techniques for high efficiency DQD solar cells.

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“…Ultra-thin silver film shows high transmittance at visible wavelengths and high reflection at infrared in D/M/D multilayer [6], and so it can obtain visible light from broadband spectrum. The ultra-thin layers provide an enhanced absorption effect using various materials [7,8].…”

Section: Introductionmentioning

confidence: 99%

Optical performance of ultra-thin silver films under the attenuated total reflection mode

Zhou

Chen

et al. 2016

Front. Optoelectron.

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Ultra-thin silver films were deposited by thermal evaporation, and the dielectric functions of samples were simulated using Drude-Lorentz oscillators. When s-polarized incident light from the BK7 glass into thin silver film at 45°angle using attenuated total reflection (ATR) mode, we experimental observed that the reflection reach a minimum of 1.87% at 520 nm for thickness of d~6.3 nm silver film, and it reach a minimum of 10.1% at 500 nm for thickness of d~4.1 nm. Moreover, we simulated the absorption changes with incident angles at 520 nm for both p-polarized (TM wave) and s-polarized (TE wave) light using transfer matrix theory, and calculated the electric field distributions. The absorption as a function of incident angles of TM wave and TE wave showed different characteristics under ATR mode, TE wave reached the maximum absorption around the critical angle θ c~4 1.1°, while TM wave reached the minimum absorption.

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Optical Properties and Surface Morphology of Thin Silver Films Deposited by Thermal Evaporation

Cited by 17 publications

References 19 publications

Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry

Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry

Delayed response to the photovoltaic performance in a double quantum dots photocell with spatially correlated fluctuation

Optical performance of ultra-thin silver films under the attenuated total reflection mode

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