2010
DOI: 10.1088/0957-4484/21/46/465203
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Optical properties of carbon nanofiber photonic crystals

Abstract: Carbon nanofibers (CNF) are used as components of planar photonic crystals. Square and rectangular lattices and random patterns of vertically aligned CNF were fabricated and their properties studied using ellipsometry. We show that detailed information such as symmetry directions and the band structure of these novel materials can be extracted from considerations of the polarization state in the specular beam. The refractive index of the individual nanofibers was found to be n CN F = 4.1.

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Cited by 7 publications
(10 citation statements)
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“…CNF arrays grown on Si have been shown earlier to work as diffraction gratings when irradiated with white light [9,10], and light transmission through nanowirebased PCs has been studied theoretically [11]. We have recently shown that variable-angle spectroscopic ellipsometry can be used to determine the band structure of CNF PCs on a metallic substrate [12]. In this Letter, the fundamental diffraction properties of CNF-based PCs are studied in detail.…”
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confidence: 92%
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“…CNF arrays grown on Si have been shown earlier to work as diffraction gratings when irradiated with white light [9,10], and light transmission through nanowirebased PCs has been studied theoretically [11]. We have recently shown that variable-angle spectroscopic ellipsometry can be used to determine the band structure of CNF PCs on a metallic substrate [12]. In this Letter, the fundamental diffraction properties of CNF-based PCs are studied in detail.…”
mentioning
confidence: 92%
“…CNFs are grown to a height of approximately 1.4 μm with a diameter of 65 nm. A more detailed description of the fabrication process can be found elsewhere [13,12]. When light interacts with an ordered array of scatterers, an integer multiple of a reciprocal lattice vector can be transferred by the lattice to the incident wave [14].…”
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confidence: 99%
“…Photonic crystal structures have drawn a lot of attention over the last two decades but the routine design of full bandgap materials in three dimensions for optical wavelengths has proven elusive [1][2][3][4][5][6][7]. Recently, disordered and isotropic photonic materials have been suggested as an alternative [8][9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…[11][12][13][14][15] In recent work we have shown that ellipsometry is a powerful technique to determine the band structure of such 2D VACNF PC and can be used to identify symmetry directions and lattice parameters. 15 We have also shown that the main features of the diffraction properties of the VACNF PC can be modelled using standard diffraction theory but observed polarization-dependent diffraction intensities required a consideration of the form factor of the VACNF array and the role of surface plasmons at the PC-substrate interface to be explained. 13 In this letter we combine these two techniques to characterise tunable VACNF PC.…”
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confidence: 99%
“…3a. 15 Ellipsometry measures the complex reflectance ratio =/a. This corresponds to the BZ edge of the VACNF square lattice.…”
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confidence: 99%