Nitride Semiconductor Devices: Principles and Simulation 2007
DOI: 10.1002/9783527610723.ch18
|View full text |Cite
|
Sign up to set email alerts
|

Optical Properties of Edge‐Emitting Lasers: Measurement and Simulation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
1
0

Year Published

2007
2007
2019
2019

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 10 publications
0
1
0
Order By: Relevance
“…This influences the threshold current, however, it should not influence the threshold current density (j th ) because in index-guided nitride LDs the threshold current scales linearly with ridge width. 29) Figure 1 shows the band profiles and wavefunctions distribution for a thin 2.6 nm and a wide 10.4 nm QWs calculated for: (a) no current injection j = 0 A cm −2 and (b) current injection j = 100 A cm −2 . The band profiles have been calculated with the SiLense 5.4 package.…”
mentioning
confidence: 99%
“…This influences the threshold current, however, it should not influence the threshold current density (j th ) because in index-guided nitride LDs the threshold current scales linearly with ridge width. 29) Figure 1 shows the band profiles and wavefunctions distribution for a thin 2.6 nm and a wide 10.4 nm QWs calculated for: (a) no current injection j = 0 A cm −2 and (b) current injection j = 100 A cm −2 . The band profiles have been calculated with the SiLense 5.4 package.…”
mentioning
confidence: 99%