2009 34th IEEE Photovoltaic Specialists Conference (PVSC) 2009
DOI: 10.1109/pvsc.2009.5411657
|View full text |Cite
|
Sign up to set email alerts
|

Optical properties of materials for concentrator photovoltaic systems

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

2
22
0

Year Published

2009
2009
2023
2023

Publication Types

Select...
7
3

Relationship

0
10

Authors

Journals

citations
Cited by 40 publications
(24 citation statements)
references
References 9 publications
2
22
0
Order By: Relevance
“…n is either directly measured directly using ellipsometry (as in ref. [9]) or extracted from a published trendline fit (such as Cauchy's dispersion law or the Sellmeier equation [7]). From Equation 3, reflective losses are minimized when n is similar between adjacent components.…”
Section: Measurement Of Candidate Components and Materialsmentioning
confidence: 99%
“…n is either directly measured directly using ellipsometry (as in ref. [9]) or extracted from a published trendline fit (such as Cauchy's dispersion law or the Sellmeier equation [7]). From Equation 3, reflective losses are minimized when n is similar between adjacent components.…”
Section: Measurement Of Candidate Components and Materialsmentioning
confidence: 99%
“…For the roller, a simpler specular reflection model is used, with the reflectivity being a function of the angle of incidence according to the Fresnel equations [15]. A roller with a polytetrafluoroethylene (PTFE) coating is considered, having a refractive index of = n 1.4 r [16]. All non-reflected light is considered to be absorbed.…”
Section: Optical Macro-modelmentioning
confidence: 99%
“…The thicknesses of the antireflective coatings were calculated through simulations, texturing of silicon solar cell was modeled based on the surface electron micrographs reported by Papet et al (2006). Optical property data of the SiNx antireflection layer was obtained from plasma enhanced chemical vapor deposition (PECVD) experiments of Kang et al (2011) and the optical property data of ethylene vinyl acetate (EVA) encapsulation layer was obtained from experiments performed by French et al (2009). Figs.…”
Section: Experimental -Device Modelingmentioning
confidence: 99%