2007
DOI: 10.1016/j.materresbull.2006.06.028
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Optical properties of nanocrystalline SnS2 thin films

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Cited by 132 publications
(62 citation statements)
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“…Its band gap varies in the range of 0.8-3.5 eV [1,2] which make it suitable as an absorber or window layer in photovoltaic solar cells. Tin sulphide has three main phases of which SnS 2 and SnS exhibit layered structure whereas Sn 2 S 3 exhibit ribbon-like structure [3].…”
Section: Introductionmentioning
confidence: 99%
“…Its band gap varies in the range of 0.8-3.5 eV [1,2] which make it suitable as an absorber or window layer in photovoltaic solar cells. Tin sulphide has three main phases of which SnS 2 and SnS exhibit layered structure whereas Sn 2 S 3 exhibit ribbon-like structure [3].…”
Section: Introductionmentioning
confidence: 99%
“…The advantages of SnS 2 are that it is non-toxic and its constituent elements (Sn and S) are cheap and Earthabundant. Tin disulfide thin films can be obtained using the following methods: ionic layer adsorption and reaction (SILAR) [18], spray pyrolysis [14,19e21], thermal vacuum evaporation [13,22], plasma-enhanced chemical vapour deposition (PECVD) [15], and dip coating [23]. Each of the methods of obtaining SnS 2 thin films has its advantages and disadvantages.…”
Section: Introductionmentioning
confidence: 99%
“…The atomic percentage of sulfur had decreased from 69.02% to 64.95% when increasing the precursor concentrations from 0.05 to 0.25 M, respectively. The nearly correct stoichiometric ratio of 33.5:66.5% was observed for tin and sulfur at the precursor concentration of 0.2 M. Panda et al [18] reported similar stoichiometric ratio for the nano crystalline SnS 2 . For 0.25 M precursor concentration, the atomic percentage of tin and sulfur was observed as 35.05 and 64.95%, respectively, which predicts the mixed phases of SnS, Sn 2 S 3 , and SnS 2 present in this film prepared with a precursor concentration of 0.25 M. The changes observed in the stoichiometric ratio with precursor concentration were also supported by the structure analysis and surface morphology.…”
mentioning
confidence: 52%
“…This (001) orientation was matched well with the JCPDS file no-23-0677. Panda et al [18] reported similar peak around 14.88°for the nano crystalline SnS 2 thin films prepared by dip-coating method. The low-intensity diffraction peak was observed around 14.8°at the precursor concentration of 0.05 M. The intensity of that (001) diffraction peak with hexagonal phase became more intense and sharp with the increase in precursor concentration up to 0.2 M, which shows an enhancement of the crystallinity of the layers.…”
Section: Structural Studiesmentioning
confidence: 69%
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