2010
DOI: 10.1016/j.tsf.2010.02.037
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Optical properties of single-wall carbon nanotube films deposited on Si/SiO2 wafers

Abstract: The paper describes a set of simple experiments performed to develop an optical model to describe Si/SiO2 substrates coated with two transparent films of carbon nanotubes. The final goal is to use such optical model to investigate the interaction of proteins with carbon nanotubes. Experiments were performed to assess light reflection as a function of the wavelength or angle of incidence using two substrates (same material, different amounts) composed of oxidized carbon nanotubes. The experimental results indic… Show more

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Cited by 32 publications
(20 citation statements)
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“…The ellipsometer was also used to measure the ellipsometric angles (Ψ and Δ) as a function of the incident wavelength, according to a procedure described elsewhere. 3-4, 37-38 In order to calculate the refractive index (n) and extinction coefficient (k) of the film, the collected data were modeled using the WVASE software package (J. A. Woollam Co., Lincoln, NE) using an optical model composed of a layer of Si (bulk; d = 1 mm), a layer of SiO 2 (d = 2.104 nm) and the OTCE.…”
Section: Methodsmentioning
confidence: 99%
“…The ellipsometer was also used to measure the ellipsometric angles (Ψ and Δ) as a function of the incident wavelength, according to a procedure described elsewhere. 3-4, 37-38 In order to calculate the refractive index (n) and extinction coefficient (k) of the film, the collected data were modeled using the WVASE software package (J. A. Woollam Co., Lincoln, NE) using an optical model composed of a layer of Si (bulk; d = 1 mm), a layer of SiO 2 (d = 2.104 nm) and the OTCE.…”
Section: Methodsmentioning
confidence: 99%
“…Although outside the scope of the present study, it is worth mentioning that other models considering the possibility of having the enzyme either adsorbed on top of the surface of the scaffold [48, 60] or distributed with a gradient of concentrations within the scaffold [61, 62] were evaluated. However, none of those models render reasonable results and were not further considered.…”
Section: Methodsmentioning
confidence: 99%
“…The complex refractive index of aluminium [10], graphite [11], soot [12] and SWCNT [13] were found in the corresponding reference literature. The refractive indexes of these materials were imported into Setfos which calculated the resulting reflectance in the wavelength range from 0.3 to 20μm for different film thicknesses.…”
Section: Simulationmentioning
confidence: 99%