1997
DOI: 10.1143/jjap.36.l177
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Optical Properties of Strained AlGaN and GaInN on GaN

Abstract: The composition of alloys in strained ternary alloy layers, Al x Ga1- x N (0<x<0.25) and Ga1- x In x N (0<x<0.20), on thick GaN was precisely determined using the high-resolution X-ray diffraction prof… Show more

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Cited by 338 publications
(187 citation statements)
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“…Samples were grown in metal organic vapor phase epitaxy (MOVPE) on (0001) sapphire substrates using low temperature deposited AlN buffer layers [24] [25]. Further details have been given in Ref.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Samples were grown in metal organic vapor phase epitaxy (MOVPE) on (0001) sapphire substrates using low temperature deposited AlN buffer layers [24] [25]. Further details have been given in Ref.…”
Section: Methodsmentioning
confidence: 99%
“…Ternary layers at a thickness of 40 nm were grown pseudomorphically onto 2 µ m GaN. Pseudomorphic growth and x were determined from high resolution x-ray diffraction of a and c lattice constants [25]. PR at room temperature was performed using a Xe-arc lamp source in near-toperpendicular reflection.…”
Section: Methodsmentioning
confidence: 99%
“…Since the change in x changes F PZ , the Q-disk size / segmented QW potential may, at least partly come from the nonrandom alloy potential fluctuation emphasized by the large bowing parameter in InGaN. 2,29,61 For LDs, the effective bandgap inhomogeneity more than 50 meV is too large to obtain an uniform EHP in the well. Indeed, some InGaN MQW LDs showed EHP lasing in tail states.…”
Section: Coulomb Screening Effects By Si-doping Of Gan Barriersmentioning
confidence: 99%
“…1,[25][26][27] On the other hand, several groups have discussed the importance of the quantum confined Stark effect (QCSE) 28 due to the piezoelectric field (F PZ ) in strained wurtzite InGaN QWs. 2,25,[29][30][31] In particular, the blueshift of the electroluminescence (EL) peak in InGaN SQW LEDs 1 with increasing drive current has been explained 1,25 by the combined effects of a reduction of QCSE due to Coulomb screening of F PZ 2,25,29 and band-filling of the energy tail states. 1,25 Moreover, characteristic optical gain mechanisms were reported for InGaN LD wafers 25,[32][33][34] although gain spectra which can be explained by the well-known e-h plasma (EHP) 35 lasing model were reported.…”
Section: Introductionmentioning
confidence: 99%
“…This technique provides a direct measurement of the stress-thickness product during MOVPE of GaN [49]. In attempting to extract band gap energy from a PL measurement for the AlGaInN quaternary system, one is reminded that the determination of band gap energy for GaInN has been a subject of much debate [50]. Indium-related compositional fluctuation is expected to contribute to a Stokes-like shift with a magnitude of less than 100 meV [51].…”
Section: Mocvd Growth Of Quaternary (Algain)n For Uv Optoelectronicsmentioning
confidence: 99%