Optical properties of ZnTe films prepared by molecular beam epitaxy

Franta, Daniel; Ohlı́dal, Ivan; Klapetek, Petr; Montaigne-Ramil, Alberto; Bonanni, A.; Stifter, David; Sitter, H.

doi:10.1016/j.tsf.2004.04.036

Cited by 31 publications

(7 citation statements)

References 15 publications

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“…Among them are molecular beam epitaxy (MBE) [2][3][4][5], metalorganic vapour phase epitaxy (MOVPE) [6,7], RF magnetron sputtering [8], electrochemical etching [9]. Nevertheless, among these various technologies the Pulsed Laser Deposition (PLD) method is a highly flexible thin-film growth technique, which has been successfully applied to a wide range of materials [10].…”

Section: Introductionmentioning

confidence: 99%

Investigation of ZnTe thin films grown by Pulsed Laser Deposition method

Kotlyarchuk

Savchuk

2007

Physica Status Solidi (b)

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This paper is devoted to optimization of the Pulsed Laser Deposition (PLD) growth condition of ZnTe films on various substrates and subsequent investigation of relevant parameters of growth process, structural, optical and electrical properties of grown films. Studies of the effect of growth parameters on the structural quality and properties of grown films were carried out. X-ray diffraction measurements showed that the ZnTe films, which have been deposited at optimal substrate temperatures, were characterized by a (111) preferred orientation with large average grain size. The optical transmission and reflectance in the energy range 1.5 -5.5 eV for films grown at various substrate temperatures were measured. We calculated the variation in the absorption coefficient with the photon energy from the transmittance spectrum for samples grown at various substrate temperatures. Obtained data were analyzed and the value of the absorption coefficient, for allowed direct transitions, has been determined as a function of photon energy. We found that the undoped ZnTe films, which were grown by the PLD method, are typically p-type and possess resistivity in the range of 103 Ω cm at room temperature.

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Section: Introductionmentioning

confidence: 99%

Investigation of ZnTe thin films grown by Pulsed Laser Deposition method

Kotlyarchuk

Savchuk

2007

Physica Status Solidi (b)

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“…Several techniques have been developed for the fabrication of ZnTe semiconductor, such as molecular beam epitaxy (MBE) [8], ionized cluster beam (ICB) [9], electrodeposition [10] and metal organic chemical vapor deposition (MOCVD) [11]. Among these techniques, electrodeposition is recognized as an attractive technique to synthesize semiconductors, because it offers many advantages, including low-temperature processing, cost-effectiveness and high degree of freedom in altering the interplay between the crystal growth rate and the mass transport rate [12].…”

Section: Introductionmentioning

confidence: 99%

Synthesis of ZnTe dendrites on multi-walled carbon nanotubes/polyimide nanocomposite membrane by electrochemical atomic layer deposition and photoelectrical property research

Jiang

Kou

et al. 2012

Journal of Solid State Chemistry

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“…with the rms values of the heights equal to several tens or hundreds nanometers) with a wide interval of spatial frequencies [1][2][3][4][5][6]. In this case it is not possible to use simple models of this roughness employed within the known theories of the interaction of light with rough surfaces that have been utilized so far (e.g.…”

Section: Introductionmentioning

confidence: 99%

Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies

Ohlı́dal

Nečas

Franta

2008

Phys. Status Solidi (c)

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Two optical methods for the optical characterization of the statistically rough surfaces exhibiting wide intervals of spatial frequencies are presented. These methods employ the combination of variable angle spectroscopic ellipsometry and near‐normal spectroscopic reflectometry. The first method is based on combining the scalar diffraction theory and effective medium theory while the second method combines the scalar diffraction theory with Rayleigh‐Rice theory.Both the methods are applied to the optical characterization of statistically rough GaAs surfaces prepared by thermal oxidation. It is shown that both the methods can be utilized for characterization of these surfaces in a reasonable way, however, the latter is more suitable for this purpose. The results of the optical characterization of the selected rough GaAs surface are supported by those obtained using atomic force microscopy. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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Optical properties of ZnTe films prepared by molecular beam epitaxy

Cited by 31 publications

References 15 publications

Investigation of ZnTe thin films grown by Pulsed Laser Deposition method

Investigation of ZnTe thin films grown by Pulsed Laser Deposition method

Synthesis of ZnTe dendrites on multi-walled carbon nanotubes/polyimide nanocomposite membrane by electrochemical atomic layer deposition and photoelectrical property research

Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies

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