“…Other publications showed the edge effect with defocus of the sample, and due to their finite tube systems, a defocus of the light is at the pinhole plane, respectively (Sheppard & Heaton, 1984; Wilson & Carlini, 1988b). To improve performances including optical sectioning, techniques, such as two‐pinhole confocal fluorescence, parallel confocal microscopy using high‐order axially symmetric polarized beams and differential confocal microscopy (DCM), are used (Lee & Wang, 1997; Martínez‐Corral, Caballero, Ibáñez‐López, & Sarafis, 2003; Zhou & Zhu, 2015). Nevertheless, all those methods need additional components, extra image postprocessing or more image acquisition time, or defocus the sample and thus decrease the resolving power of the system.…”