2019
DOI: 10.1080/14786435.2019.1599145
|View full text |Cite
|
Sign up to set email alerts
|

Optical spectroscopy study of modifications induced in cerium dioxide by electron and ion irradiations

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
6
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 10 publications
(6 citation statements)
references
References 43 publications
0
6
0
Order By: Relevance
“…Both XAS and XPS are valuable characterization tools for CeO 2 due to its tendency to chemically reduce under highly ionizing irradiation. Raman spectroscopy reveals the impact of defects on correlated atomic vibrations [38,50,56]. Structural modifications in fluorite-structured materials lead to a breakdown of selection rules and the appearance of so-called Raman forbidden modes in the spectra.…”
Section: Characterizationmentioning
confidence: 99%
“…Both XAS and XPS are valuable characterization tools for CeO 2 due to its tendency to chemically reduce under highly ionizing irradiation. Raman spectroscopy reveals the impact of defects on correlated atomic vibrations [38,50,56]. Structural modifications in fluorite-structured materials lead to a breakdown of selection rules and the appearance of so-called Raman forbidden modes in the spectra.…”
Section: Characterizationmentioning
confidence: 99%
“…Regarding ceria, among several experimental techniques, such as transmission electron microscopy (TEM) [16][17], scanning transmission electron microscopy (STEM) [18], and various spectroscopies, such as electron paramagnetic resonance (EPR) spectroscopy [19] and UV-visible absorption or reflection spectroscopy [14,20], were applied to study the point defects produced 4 after electron or ion irradiations. These results have revealed the formation of Ce 3+ ions after irradiation.…”
Section: Introductionmentioning
confidence: 99%
“…The estimated probed depth of d ~ 2.3 μm in CeO 2 by Raman spectroscopy relies on the absorbance at RT of a 1‐μm thick epitaxial film at the wavelength of 532 nm, for 63% attenuation of the scattered light. [ 19 ] However, this value is definitely overestimated owing to light scattering at grain boundaries of the sintered samples. This means that mainly the topmost part of the irradiated depth was probed.…”
Section: Resultsmentioning
confidence: 99%
“…[ 25 ] This yields a probed depth of d = 1/ α ~ 3.6 mm, for 63% attenuation of the scattered light, which means that the whole sample thickness was probed in that case. The difference in probed depths for the photon energy of ħω = 2.33 eV lies in the difference in optical gap of ~4.2 eV [ 25 ] and ~3.2 eV, [ 19,22 ] respectively, and Urbach edge for YSZ and CeO 2 . The estimate of the probed depth by Raman spectroscopy in CeO 2 is marked by a vertical line in the depth profiles (Figure 1).…”
Section: Resultsmentioning
confidence: 99%