1993
DOI: 10.1117/12.163650
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Optical system design of the Voltage ImagingTMoptical subsystem (VIOS) in AMLCD in-process test system (IPT)

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“…Electrical testing of Thin-Film Transistor (TFT) backplanes used in Liquid Crystal Displays is usually done using voltage measurement techniques such as Photon Dynamic's, an Orbotech Company, Voltage Imaging TM technology [1] or secondary electron voltage measurements [2]. Voltage imaging TM technology has also successfully been applied to Active Matrix Organic Light Emitting Diode (AMOLED) displays.…”
Section: Introductionmentioning
confidence: 99%
“…Electrical testing of Thin-Film Transistor (TFT) backplanes used in Liquid Crystal Displays is usually done using voltage measurement techniques such as Photon Dynamic's, an Orbotech Company, Voltage Imaging TM technology [1] or secondary electron voltage measurements [2]. Voltage imaging TM technology has also successfully been applied to Active Matrix Organic Light Emitting Diode (AMOLED) displays.…”
Section: Introductionmentioning
confidence: 99%